ABSTRACT
Detecting nanomechanical motion has become an important challenge in science and technology. Recently, electromechanical coupling to focused electron beams has emerged as a promising method adapted to ultralow scale systems. However the fundamental measurement processes associated with such complex interaction remain to be explored. Here we report a highly sensitive detection of the Brownian motion of µm-long semiconductor nanowires (InAs). The measurement imprecision is found to be set by the shot noise of the secondary electrons generated along the electromechanical interaction. By carefully analyzing the nanoelectromechanical dynamics, we demonstrate the existence of a radial backaction process that we identify as originating from the momentum exchange between the electron beam and the nanomechanical device, which is also known as radiation pressure.
ABSTRACT
We investigate the impact of the Petermann-excess-noise factor K>/=1 on the possibility of intensity noise squeezing of laser light below the standard quantum limit. Using an N-mode model, we show that squeezing is limited to a floor level of 2(K-1) times the shot noise limit. Thus, even a modest Petermann factor significantly impedes squeezing, which becomes impossible when K>/=1.5. This appears as a serious limitation for obtaining sub-shot-noise light from practical semiconductor lasers. We present experimental evidence for our theory.
