ABSTRACT
Data about gamma radiation induced effects in Ge40Se60 chalcogenide thin films and radiation induced silver diffusion within these are presented. Blanket films and devices were created to study the structural changes, diffusion products, and device performance. Raman spectroscopy, X-ray diffraction, current vs. voltage (I-V) and impedance measurements expound the behavior of Ge40Se60 glass and silver diffusion within this glass under radiation. Raman study shows that there is a decrease in the area ratio between edge shared and corner shared structural units revealing structural reorganization occurring in the glasses as a result of gamma radiation. X-ray diffraction studies revealed that with sufficiently radiation dose it is also possible to create Ag2Se in selenium-depleted systems. Oxidation of the Ge enriched chalcogenide backbone is confirmed through the electrical performance of the sensing elements based on these films. Combination of these structural and diffusion products influences the device performance. The I-V behavior is characterized by increase in current and then stabilization as a function of radiation dose. Additionally, device modeling is also presented using Silvaco software and analytical methods to shed light on the device behavior. This type of sensor design and material characterizations facilitate in improving the radiation sensing capabilities of silver containing chalcogenide glass thin films.
Subject(s)
Chalcogens/chemistry , Radiation Equipment and Supplies , Radioactive Waste/analysis , Cobalt Radioisotopes , Diffusion , Gamma Rays , Germanium , Indicators and Reagents , Selenium , Silver/chemistry , Software , Spectrometry, X-Ray Emission , Spectrum Analysis, Raman , X-Ray DiffractionABSTRACT
The temperature dependence of the frequencies and linewidths of the Raman-active longitudinal optical (LO) phonons in GaAs and AlAs have been measured. The low-temperature lifetime of the LO phonon in AlAs is found to be 9.7 ps, very close to the corresponding GaAs value of 9.5 ps. This contradicts early theoretical predictions. The agreement between theory and experiment can be restored when the accidental degeneracy between the AlAs LO phonon frequency and a feature in the two-phonon density of states is taken into account.
ABSTRACT
Two compounds SiC and AlN, normally insoluble in each other below approximately 2000 degrees C, are synthesized as a single-phase solid-solution thin film by molecular beam epitaxy at 750 degrees C. The growth of epitaxial SiCAlN films with hexagonal structure takes place on 6H-SiC(0001) substrates. Two structural models for the hexagonal SiCAlN films are constructed based on first-principles total-energy density functional theory calculations, each showing agreement with the experimental microstructures observed in cross-sectional transmission electron microscopy images. The predicted fundamental band gap is 3.2 eV for the stoichiometric SiCAlN film.
