ABSTRACT
AIM: To analyze surface roughness and three-dimensional (3D) scanning topography parameters of zirconia implants before and after photofunctionalization by atomic force microscopy (AFM). MATERIALS AND METHODS: Ten commercially available zirconia implants five each in the study and control group were taken. The study group was subjected to ultraviolet (UV) radiation for 48 h using the shorter wavelength of 254 nm. After washing all the implants with 70% alcohol and drying, 3D surface topography and roughness parameters were analyzed using CSC 17 probe AFM at three different magnifications 25 µm, 50 µm, and 80 µm, respectively. RESULTS: The surface topography and calculated mean amplitude, spatial, and hybrid parameters of the study group were higher than the control group (P < 0.05) in all three magnifications. Up to scale depth and peak value for the study and control group were (-0.4-0.4: -2-1) (-0.75 to 0.6:-1-1.3) (-0.75--0.5: -1.5-1.3) for the study and control group at 25, 50, and 80 µm magnification, respectively. This indicates that photofunctionalization increased surface roughness of Zirconia implants to desirable extent. CONCLUSION: There is a definite difference in the quantitative topographic characteristics with zirconia implants being microroughned after photofunctionalization (UV treatment).
