ABSTRACT
The structure of Ni-C multilayer and single nickel layer samples has been analyzed before and after annealing, using two techniques: fluorescence EXAFS (F1EXAFS) at the Ni-K. edge and CuKα reflection. Annealing at a temperature of 450°C resulted in a change in the structure of the nickel layers from amorphous like to crystalline like. A reduction of the Bragg reflectivity by a factor of 7 was also found. Comparison between the EXAFS data of the annealed sample and of a nickel foil show a difference in the amplitude of the EXAFS. This is ascribed to a non-Gaussian atomic distribution of the backscattering atoms in the annealed sample around their average positions, whereas the atomic distribution in the (polycrystalline) Ni foil is a Gaussian one. From the annealing experiments we conclude that no irreversible changes take place in the structure of the nickel layers at temperatures below 200°C.
ABSTRACT
A laminar grating of 1200 1/mm was coated with an x-ray reflecting multilayer coating. The multilayer coating consisted of 41 alternating layers of ReW and C having a period of 2.3 nm. In this paper we report on diffraction measurements of the coated grating at the CuKα emission line. We describe its reflection behavior using a simple theoretical model and derive two diffraction conditions, corresponding to the grating relation and the Bragg law, for which peak intensities are to be observed. We find that grating order efficiencies are modulated by the multilayer reflection.
