ABSTRACT
Chromatic confocal microscopy has the advantage of short measurement times because of its parallel depth scan. As most white-light sources have limited optical output power, light-efficient setups are necessary. Using an extended detection pinhole is one way to improve light efficiency. We have calculated the effect of extended pinholes in chromatic confocal setups. We found that, for certain pinhole sizes, the FWHM of the confocal signal is nearly constant over a large wavelength interval.
Subject(s)
Microscopy, Confocal/methods , Spectrum Analysis/methods , Microscopy, Confocal/instrumentation , Optics and PhotonicsABSTRACT
The confocal-detection principle is open especially for use in medical applications. For inspection systems applications for technical objects in reflection confocal setups are of growing importance. For such applications the confocal measurements need to have a very short measuring time. A fast detection system is needed and to satisfy this requirement only a small number of height levels are measured and a fast-evaluation algorithm is used. Drawbacks of the reduction of height levels are a greater influence of noise and additional systematic errors on the measured heights. Study the effects of the reduction are calculated, different evaluation algorithms are analyzed, and the optimization of the parameters is discussed.
