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1.
Adv Mater ; : e2403904, 2024 Jul 19.
Article in English | MEDLINE | ID: mdl-39030848

ABSTRACT

Modern graph datasets with structural complexity and uncertainties due to incomplete information or data variability require advanced modeling techniques beyond conventional graph models. This study introduces a memristive crossbar array (CBA)-based probabilistic graph model (C-PGM) utilizing Cu0.3Te0.7/HfO2/Pt memristors, which exhibit probabilistic switching, self-rectifying, and memory characteristics. C-PGM addresses the complexities and uncertainties inherent in structural graph data across various domains, leveraging the probabilistic nature of memristors. C-PGM relies on the device-to-device variation across multiple memristive CBAs, overcoming the limitations of previous approaches that rely on sequential operations, which are slower and have a reliability concern due to repeated switching. This new approach enables the fast processing and massive implementation of probabilistic units at the expense of chip area. In this study, the hardware-based C-PGM feasibly expresses small-scale probabilistic graphs and shows minimal error in aggregate probability calculations. The probability calculation capabilities of C-PGM are applied to steady-state estimation and the PageRank algorithm, which is implemented on a simulated large-scale C-PGM. The C-PGM-based steady-state estimation and PageRank algorithm demonstrate comparable accuracy to conventional methods while significantly reducing computational costs.

2.
ACS Appl Mater Interfaces ; 16(12): 15032-15042, 2024 Mar 27.
Article in English | MEDLINE | ID: mdl-38491936

ABSTRACT

Nanodevice oscillators (nano-oscillators) have received considerable attention to implement in neuromorphic computing as hardware because they can significantly improve the device integration density and energy efficiency compared to complementary metal oxide semiconductor circuit-based oscillators. This work demonstrates vertically stackable nano-oscillators using an ovonic threshold switch (OTS) for high-density neuromorphic hardware. A vertically stackable Ge0.6Se0.4 OTS-oscillator (VOTS-OSC) is fabricated with a vertical crossbar array structure by growing Ge0.6Se0.4 film conformally on a contact hole structure using atomic layer deposition. The VOTS-OSC can be vertically integrated onto peripheral circuits without causing thermal damage because the fabrication temperature is <400 °C. The fabricated device exhibits oscillation characteristics, which can serve as leaky integrate-and-fire neurons in spiking neural networks (SNNs) and coupled oscillators in oscillatory neural networks (ONNs). For practical applications, pattern recognition and vertex coloring are demonstrated with SNNs and ONNs, respectively, using semiempirical simulations. This structure increases the oscillator integration density significantly, enabling complex tasks with a large number of oscillators. Moreover, it can enhance the computational speed of neural networks due to its rapid switching speed.

3.
Nanoscale ; 15(40): 16390-16402, 2023 Oct 20.
Article in English | MEDLINE | ID: mdl-37791415

ABSTRACT

This work investigates the impact of the magnitude of cycling voltage on the fatigue characteristics of 40 nm-thick AlScN ferroelectric thin film. The fatigue rate and the rejuvenation of remanent polarization vary with the cycling voltage. The primary fatigue mechanism is identified to be the interfacial layer formation and domain wall pinning at high and low cycling voltages, respectively. Additionally, annealing the film under the NH3 atmosphere decreases the fatigue rate and improves endurance by eliminating impurities in the film. The amount of trapped charges at the interface also decreases after NH3 annealing, leading to a reduction in leakage current. Furthermore, the ferroelectric performance of the AlScN film is not degraded after the thermal annealing at 900 °C under the NH3 environment, suggesting its robustness against the severe thermal budget. It is concluded that NH3 annealing is a promising method to address the reliability issue of the AlScN film.

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