The predominance of substrate induced defects in magnetic properties of Sr2FeMoO6 thin films.

A systematic study of epitaxially grown Sr2FeMoO6 thin films on SrTiO3, (LaAlO3)0.3(Sr2AlTaO6)0.7, SrLaAlO4 and MgO single crystal substrates were made. Transmission electron microscopy investigations showed sharp substrate/films interfaces and increased defect concentration with increased lattice mismatch, indicating defect formation such as dislocations, low angle grain boundaries and stacking faults as a strain relaxation mechanism. Large enough compressive mismatch cause the over-relaxation of the lattice parameters through reorganization or interface defects, which was observed as a tensile strain in films with compressive mismatch larger than -1.05%. All the films with compressive mismatch were phase pure and epitaxially textured while signatures of SrMoO4 parasitic particle was found only in the film grown on MgO. No correlation between the antisite disorder and other structural defects or magnetic properties were found. Instead, the saturation magnetization, Curie temperature, magnetic domain rotation etc are higly dependent on the lattice mismatch induced defects, which outshines the possible correlation with B-site ordering.

Absence of traditional magnetoresistivity mechanisms in Sr2FeMoO6 thin films grown on SrTiO3, MgO and NdGaO3 substrates.

Magnetoresistive double perovskite Sr(2)FeMoO(6) thin films were grown with two different deposition pressures on SrTiO(3), MgO and NdGaO(3) substrates by pulsed laser deposition and thorough structural, magnetic and magneto-transport characterization was made. According to x-ray diffraction, all the films were phase pure and fully textured. Indication of substrate dependent strain and low angle grain boundaries was found, especially in films on MgO. Both the deposition pressure and the choice of the substrate have a strong influence on the saturation magnetization, M(s), and Curie temperature, T(C). The structural and magnetic data indicate the presence of anti-site disorder (ASD) in the films. The temperature dependence of resistivity showed semiconductive behaviour at temperatures below 100 K and metallic behaviour at higher temperatures. The semiconductive behaviour was found to increase with increasing ASD. In good quality films, up to 12% negative magnetoresistance (MR) was observed and films grown on MgO and NGO substrates also showed low field MR. However, the most significant observation of this study was that the magnetoresistivity of these Sr(2)FeMoO(6) thin films could not be explained with any traditional MR mechanism, but carried the clear signature of superposition of different mechanisms, in particular low angle grain boundary tunnelling and suppression of antiferromagnetically ordered domains under a magnetic field.