Development towards high-resolution kHz-speed rotation-free volumetric imaging.

X-ray multi-projection imaging (XMPI) has the potential to provide rotation-free 3D movies of optically opaque samples. The absence of rotation enables superior imaging speed and preserves fragile sample dynamics by avoiding the centrifugal forces introduced by conventional rotary tomography. Here, we present our XMPI observations at the ID19 beamline (ESRF, France) of 3D dynamics in melted aluminum with 1000 frames per second and 8 µm resolution per projection using the full dynamical range of our detectors. Since XMPI is a method under development, we also provide different tests for the instrumentation of up to 3000 frames per second. As the high-brilliance of 4th generation light-sources becomes more available, XMPI is a promising technique for current and future X-ray imaging instruments.

Resolution of a bent-crystal spectrometer for X-ray free-electron laser pulses: diamond versus silicon.

The resolution function of a spectrometer based on a strongly bent single crystal (bending radius of 10 cm or less) is evaluated. It is shown that the resolution is controlled by two parameters: (i) the ratio of the lattice spacing of the chosen reflection to the crystal thickness and (ii) a single parameter comprising crystal thickness, its bending radius, distance to a detector, and anisotropic elastic constants of the chosen crystal. The results allow the optimization of the parameters of bent-crystal spectrometers for the hard X-ray free-electron laser sources.

X-ray diffraction from strongly bent crystals and spectroscopy of X-ray free-electron laser pulses.

The use of strongly bent crystals in spectrometers for pulses of a hard X-ray free-electron laser is explored theoretically. Diffraction is calculated in both dynamical and kinematical theories. It is shown that diffraction can be treated kinematically when the bending radius is small compared with the critical radius given by the ratio of the Bragg-case extinction length for the actual reflection to the Darwin width of this reflection. As a result, the spectral resolution is limited by the crystal thickness, rather than the extinction length, and can become better than the resolution of a planar dynamically diffracting crystal. As an example, it is demonstrated that spectra of the 12 keV pulses can be resolved in the 440 reflection from a 20 µm-thick diamond crystal bent to a radius of 10 cm.

Diffraction properties of a strongly bent diamond crystal used as a dispersive spectrometer for XFEL pulses.

Self-amplified spontaneous emission (SASE) enables X-ray free-electron lasers (XFELs) to generate hard X-ray pulses of sub-100 fs duration. However, due to the stochastic nature of SASE, the energy spectrum fluctuates from pulse to pulse. Many experiments that employ XFEL radiation require the resolution of the spectrum of each pulse. The work presented here investigates the capacity of a thin strongly bent diamond crystal to resolve the energy spectra of hard X-ray SASE pulses by studying its diffraction properties. Rocking curves of the symmetric C*(440) reflection have been measured for different bending radii. The experimental data match the theoretical modelling based on the Takagi-Taupin equations of dynamical diffraction. A uniform strain gradient has proven to be a valid model of strain deformations in the crystal.

Wavefront-propagation simulations supporting the design of a time-delay compensating monochromator beamline at FLASH2.

Wavefront-propagation simulations have been performed to complete the design of a monochromator beamline for FLASH2, the variable-gap undulator line at the soft X-ray free-electron laser in Hamburg (FLASH). Prior to propagation through the beamline optical elements, the parameters of the photon source were generated using the GENESIS code which includes the free-electron laser experimental data. Threshold tolerances for the misalignment of mirror angles are calculated and, since diffraction effects were included in the simulations, the minimum quality with respect to the slope errors required for the optics is determined.

Effect of the surface roughness on X-ray absorption by mirrors operating at extremely small grazing angles.

This study theoretically analyzes an increase in X-ray absorption by a grazing incidence mirror due to its surface roughness. We demonstrate that the increase in absorption can be several hundred times larger than predicted by the Nevot-Croce formula. As a result, absorption enhances by several times compared to a perfectly smooth mirror despite the extremely small grazing angle of an incident X-ray beam (a fraction of the critical angle of the total external reflection) and the high quality of the reflecting surface (the roughness height was 0.5 nm in modeling). The main contribution to the absorption increase was dictated by the mid-scale roughness (waviness) of the virgin substrate surface, whose quality thus defines an absorption enhancement. The approach was applied to the analysis of two real mirrors used in a synchrotron (BESSY-I) and a European X-ray free-electron laser (XFEL) beamline. The modern surface finishing technology of elastic emission machining provides extremely low substrate waviness, guaranteeing the negligible effect of the surface roughness on the absorption increase.

Start-to-end simulation of single-particle imaging using ultra-short pulses at the European X-ray Free-Electron Laser.

Single-particle imaging with X-ray free-electron lasers (XFELs) has the potential to provide structural information at atomic resolution for non-crystalline biomolecules. This potential exists because ultra-short intense pulses can produce interpretable diffraction data notwithstanding radiation damage. This paper explores the impact of pulse duration on the interpretability of diffraction data using comprehensive and realistic simulations of an imaging experiment at the European X-ray Free-Electron Laser. It is found that the optimal pulse duration for molecules with a few thousand atoms at 5 keV lies between 3 and 9 fs.

X-ray spectrometer based on a bent diamond crystal for high repetition rate free-electron laser applications.

A precise spectral characterization of every single pulse is required in many x-ray free-electron laser (XFEL) experiments due to the fluctuating spectral content of self-amplified spontaneous emission (SASE) beams. Bent single-crystal spectrometers can provide sufficient spectral resolution to resolve the SASE spikes while also covering the full SASE bandwidth. To better withstand the high heat load induced by the 4.5 MHz repetition rate of pulses at the forthcoming European XFEL facility, a spectrometer based on single-crystal diamond has been developed. We report a direct comparison of the diamond spectrometer with its Si counterpart in experiments performed at the Linac Coherent Light Source.

WavePropaGator: interactive framework for X-ray free-electron laser optics design and simulations.

This article describes the WavePropaGator (WPG) package, a new interactive software framework for coherent and partially coherent X-ray wavefront propagation simulations. The package has been developed at European XFEL for users at the existing and emerging free-electron laser (FEL) facilities, as well as at the third-generation synchrotron sources and future diffraction-limited storage rings. The WPG addresses the needs of beamline scientists and user groups to facilitate the design, optimization and improvement of X-ray optics to meet their experimental requirements. The package uses the Synchrotron Radiation Workshop (SRW) C/C++ library and its Python binding for numerical wavefront propagation simulations. The framework runs reliably under Linux, Microsoft Windows 7 and Apple Mac OS X and is distributed under an open-source license. The available tools allow for varying source parameters and optics layouts and visualizing the results interactively. The wavefront history structure can be used for tracking changes in every particular wavefront during propagation. The batch propagation mode enables processing of multiple wavefronts in workflow mode. The paper presents a general description of the package and gives some recent application examples, including modeling of full X-ray FEL beamlines and start-to-end simulation of experiments.

A comprehensive simulation framework for imaging single particles and biomolecules at the European X-ray Free-Electron Laser.

The advent of newer, brighter, and more coherent X-ray sources, such as X-ray Free-Electron Lasers (XFELs), represents a tremendous growth in the potential to apply coherent X-rays to determine the structure of materials from the micron-scale down to the Angstrom-scale. There is a significant need for a multi-physics simulation framework to perform source-to-detector simulations for a single particle imaging experiment, including (i) the multidimensional simulation of the X-ray source; (ii) simulation of the wave-optics propagation of the coherent XFEL beams; (iii) atomistic modelling of photon-material interactions; (iv) simulation of the time-dependent diffraction process, including incoherent scattering; (v) assembling noisy and incomplete diffraction intensities into a three-dimensional data set using the Expansion-Maximisation-Compression (EMC) algorithm and (vi) phase retrieval to obtain structural information. We demonstrate the framework by simulating a single-particle experiment for a nitrogenase iron protein using parameters of the SPB/SFX instrument of the European XFEL. This exercise demonstrably yields interpretable consequences for structure determination that are crucial yet currently unavailable for experiment design.

Exploring the wavefront of hard X-ray free-electron laser radiation.

The high photon flux and femtosecond pulse duration of hard X-ray free-electron lasers have spurred a large variety of novel and fascinating experiments in physical, chemical and biological sciences. Many of these experiments depend fundamentally on a clean, well-defined wavefront. Here we explore the wavefront properties of hard X-ray free-electron laser radiation by means of a grating interferometer, from which we obtain shot-to-shot wavefront information with an excellent angular sensitivity on the order of ten nanoradian. The wavefront distortions introduced by optical elements are observed in-situ and under operational conditions. The source-point position and fluctuations are measured with unprecedented accuracy in longitudinal and lateral direction, both during nominal operation and as the X-ray free-electron laser is driven into saturation.