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1.
J Appl Crystallogr ; 49(Pt 5): 1704-1712, 2016 Oct 01.
Article in English | MEDLINE | ID: mdl-27738417

ABSTRACT

Nanostructuring of surfaces and two-dimensional materials using swift heavy ions offers some unique possibilities owing to the deposition of a large amount of energy localized within a nanoscale volume surrounding the ion trajectory. To fully exploit this feature, the morphology of nanostructures formed after ion impact has to be known in detail. In the present work the response of a rutile TiO2 (001) surface to grazing-incidence swift heavy ion irradiation is investigated. Surface ion tracks with the well known intermittent inner structure were successfully produced using 23 MeV I ions. Samples irradiated with different ion fluences were investigated using atomic force microscopy and grazing-incidence small-angle X-ray scattering. With these two complementary approaches, a detailed description of the swift heavy ion impact sites, i.e. the ion tracks on the surface, can be obtained even for the case of multiple ion track overlap. In addition to the structural investigation of surface ion tracks, the change in stoichiometry of the rutile TiO2 (001) surface during swift heavy ion irradiation was monitored using in situ time-of-flight elastic recoil detection analysis, and a preferential loss of oxygen was found.

2.
Appl Opt ; 48(22): 4430-6, 2009 Aug 01.
Article in English | MEDLINE | ID: mdl-19649048

ABSTRACT

A simple method is proposed for the refractive index measurement of thick solid and liquid layers. In contrast to interferometric methods, no mirrors are used, and the experimental setup is undemanding and simple. The method is based on the variation of transmission caused by optical interference within the layer as a function of incidence angle. A new equation is derived for the positions of the interference extrema versus incidence angle. Scattering at the surfaces and within the sample, as well as weak absorption, do not play important roles. The method is illustrated by the refractive index measurements of sapphire, window glass, and water.

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