ABSTRACT
After almost 35 years of truly successful and transformative advancements, Atomic Force Microscopy (AFM) and, in general, scanning probe microscopy still have a fundamental limitation. This is constant drift and uncontrolled motion of probe and tested surface structures with respect to each other. This is inherently linked to the currently accepted design principle-only forces are measured, and distances are inferred from force measurements and piezo motions. Here, we demonstrate and test a new setup, which combines advantages of AFM and the surface forces apparatus, where absolute distances are measured by Multiple Beam White Light Interferometry (MBI). The novel and unique aspect of this apparatus consists of a synergistic combination of white light interferometric measurement of the absolute distance by direct reflection from an AFM cantilever and a fast distance clamping and drift correction using an IR-laser Fabry-Pérot interferometry-based approach (FPI). We demonstrate the capabilities of the system by force/distance measurements, benchmarking of distance control by direct comparison of MBI and FPI, and discuss potential applications of the system. This novel setup has the potential to form, monitor, and stress a single molecule or ligand/receptor bond on the molecular hook with sub-nanometer control of molecular distances over in principle infinite times.
ABSTRACT
Multiple beam interferometry (MBI) evolved as a powerful tool for the simultaneous evaluation of thin film thicknesses and refractive indices in Surface Forces Apparatus (SFA) measurements. However, analysis has relied on simplifications for providing fast or simplified analysis of recorded interference spectra. Here, we describe the implementation of new optics and a generalized fitting approach to 4 × 4 transfer matrix method simulations for the SFA. Layers are described by dispersive complex refractive indices, thicknesses, and Euler angles that can be fitted, providing modeling for birefringent or colored layers. Normalization of data by incident light intensities is essential for the implementation of a fitting approach. Therefore, a modular optical system is described that can be retrofit to any existing SFA setup. Real-time normalization of spectra by white light is realized, alignment procedures are considerably simplified, and direct switching between transmission and reflection modes is possible. A numerical approach is introduced for constructing transfer matrices for birefringent materials. Full fitting of data to the simulation is implemented for arbitrary multilayered stacks used in SFA. This enables self-consistent fitting of mirror thicknesses, birefringence, and relative rotation of anisotropic layers (e.g., mica), evaluation of reflection and transmission mode spectra, and simultaneous fitting of thicknesses and refractive indices of media confined between two surfaces. In addition, a fast full spectral fitting method is implemented for providing a possible real-time analysis with up to 30 fps. We measure and analyze refractive indices of confined cyclohexane, the thickness of lipid bilayers, the thickness of metal layers, the relative rotation of birefringent materials, contact widths, as well as simultaneous fitting of both reflection and transmission mode spectra of typical interferometers. Our analyses suggest a number of best practices for conducting SFA and open MBI in an SFA for increasingly complex systems, including metamaterials, multilayered anisotropic layers, and chiral layers.
