Studies of atomic diffusion in Ni-Pt solid solution by x-ray photon correlation spectroscopy.

Atomic scale x-ray photon correlation spectroscopy (aXPCS) was used to study atomic diffusion in the Ni(97)Pt(3) solid solution with both a single crystal and a polycrystalline sample. Different jump diffusion models are discussed using experimental results and Monte Carlo simulations. The sensitivity of aXPCS experiments to short-range order (in this case governed by a strong Pt-Pt repulsive force) is demonstrated. The activation energy of 2.93(10) eV as well as diffusivities in the range of 10(-23) m(2) s(-1) at 830 K agree very well with the results of tracer diffusion studies at much higher temperatures.

Atomic diffusion studied with coherent X-rays.

Knowledge of atomic diffusion is a fundamental issue in synthesis and stability of materials. Direct studies of the elementary diffusion event, that is, how the individual atoms 'jump', are scarce, as the available techniques are limited to selected systems. Here we show how by monitoring the spatial and temporal variations of the scattered coherent X-ray intensity the diffusion of single atoms can be studied. This is demonstrated for the intermetallic alloy Cu(90)Au(10). By measuring along several directions in reciprocal space, we can elucidate the dynamical behaviour of single atoms as a function of their neighbourhood. This method, usually referred to as X-ray photon correlation spectroscopy (XPCS), does not rely on specific atomic species or isotopes and can thus be applied to almost any system. Thus, given the advent of the next-generation X-ray sources, XPCS has the potential to become the main method for quantitatively understanding diffusion on the atomic scale.

An ultrahigh vacuum system for in situ studies of thin films and nanostructures by nuclear resonance scattering of synchrotron radiation.

A multifunctional ultrahigh vacuum (UHV) system has been set up at the nuclear resonance beamline ID18 of the European Synchrotron Radiation Facility (ESRF). Thin and ultrathin films, nanoislands and -wires, multilayers, and stoichiometric oxides can be prepared by molecular beam epitaxy and characterized by low-energy electron diffraction, Auger electron spectroscopy, and reflection high-energy electron diffraction. Upon characterization the sample is transferred under UHV conditions to the chamber for experiments with the synchrotron beam. Electronic and magnetic properties, vibrational dynamics, and diffusion phenomena can be investigated by several synchrotron radiation based techniques, such as nuclear forward scattering, nuclear inelastic and quasielastic scattering, synchrotron radiation based perturbed angular correlations, and nuclear and electronic reflectivity. In addition, two portable UHV chambers serve to transfer the sample to other beamlines profiting from the available experimental techniques at the ESRF.

Detrended fluctuation analysis in x-ray photon correlation spectroscopy for determining coarsening dynamics in alloys.

We study the dynamics of precipitate coarsening in phase-separating alloys at late stages of phase separation by x-ray photon correlation spectroscopy (XPCS). For analyzing time series of fluctuating speckle intensities from small-angle scattering of coherent x rays, the method of detrended fluctuation analysis (DFA), which is ideal for determining power-law correlations, is applied. We discuss the application of DFA with respect to XPCS data by means of simulated time series. In particular, the effects of different signal-to-noise ratios are examined. Results from measurements of the two model systems Al-6 at. % Ag at 140 degrees C and Al-9 at. % Zn at 0 degrees C are presented. Since the DFA effectively removes adulterating trends in the data, quantitative agreement with Monte Carlo simulations is obtained. It is verified that two different coarsening mechanisms are predominant in the two systems--coarsening either by diffusion of single atoms or by movement of whole precipitates.

Transient interface sharpening in miscible alloys.

We observed that diffuse interfaces sharpen rather than broaden in completely miscible ideal binary systems. This is shown in situ during heat treatments at gradually increasing temperatures by scattering of synchrotron radiation in coherent Mo/V multilayers containing initially diffuse interfaces. This effect provides a useful tool for the improvement of interfaces and offers a way to fabricate better x-ray or neutron mirrors, microelectronic devices, or multilayers with giant magnetic resistance.

Diffusion in solids studied by nuclear resonant X-ray and neutron scattering.

Nuclear resonant scattering of synchrotron radiation and quasielastic neutron scattering allow the measurement of frequencies, directions and lengths of jumps of diffusing atoms. Both methods have been successfully applied to diffusion in solids. Synergies and respective advantages of these two techniques as well as recent developments are discussed on the basis of an example: diffusion in intermetallic alloys.