Probing Qubit Memory Errors at the Part-per-Million Level.

Robust qubit memory is essential for quantum computing, both for near-term devices operating without error correction, and for the long-term goal of a fault-tolerant processor. We directly measure the memory error ε_{m} for a ^{43}Ca^{+} trapped-ion qubit in the small-error regime and find ε_{m}<10^{-4} for storage times t≲50 ms. This exceeds gate or measurement times by three orders of magnitude. Using randomized benchmarking, at t=1 ms we measure ε_{m}=1.2(7)×10^{-6}, around ten times smaller than that extrapolated from the T_{2}^{*} time, and limited by instability of the atomic clock reference used to benchmark the qubit.

High-Fidelity Trapped-Ion Quantum Logic Using Near-Field Microwaves.

We demonstrate a two-qubit logic gate driven by near-field microwaves in a room-temperature microfabricated surface ion trap. We introduce a dynamically decoupled gate method, which stabilizes the qubits against fluctuating energy shifts and avoids the need to null the microwave field. We use the gate to produce a Bell state with fidelity 99.7(1)%, after accounting for state preparation and measurement errors. The gate is applied directly to ^{43}Ca^{+} hyperfine "atomic clock" qubits (coherence time T_{2}^{*}≈50 s) using the oscillating magnetic field gradient produced by an integrated microwave electrode.

High-Fidelity Quantum Logic Gates Using Trapped-Ion Hyperfine Qubits.

We demonstrate laser-driven two-qubit and single-qubit logic gates with respective fidelities 99.9(1)% and 99.9934(3)%, significantly above the ≈99% minimum threshold level required for fault-tolerant quantum computation, using qubits stored in hyperfine ground states of calcium-43 ions held in a room-temperature trap. We study the speed-fidelity trade-off for the two-qubit gate, for gate times between 3.8 µs and 520 µs, and develop a theoretical error model which is consistent with the data and which allows us to identify the principal technical sources of infidelity.