ABSTRACT
Pristine monocrystalline graphene is claimed to be the strongest material known with remarkable mechanical and electrical properties. However, graphene made with scalable fabrication techniques is polycrystalline and contains inherent nanoscale line and point defects--grain boundaries and grain-boundary triple junctions--that lead to significant statistical fluctuations in toughness and strength. These fluctuations become particularly pronounced for nanocrystalline graphene where the density of defects is high. Here we use large-scale simulation and continuum modelling to show that the statistical variation in toughness and strength can be understood with 'weakest-link' statistics. We develop the first statistical theory of toughness in polycrystalline graphene, and elucidate the nanoscale origins of the grain-size dependence of its strength and toughness. Our results should lead to more reliable graphene device design, and provide a framework to interpret experimental results in a broad class of two-dimensional materials.
ABSTRACT
The rate of convergence in extreme value statistics is nonuniversal and can be arbitrarily slow. Further, the relative error can be unbounded in the tail of the approximation, leading to difficulty in extrapolating the extreme value fit beyond the available data. We introduce the T method, and show that by using simple nonlinear transformations the extreme value approximation can be rendered rapidly convergent in the bulk, and asymptotic in the tail, thus fixing both issues. The transformations are often parametrized by just one parameter, which can be estimated numerically. The classical extreme value method is shown to be a special case of the proposed method. We demonstrate that vastly improved results can be obtained with almost no extra cost.
ABSTRACT
Structural rearrangements control a wide range of behavior in amorphous materials, and visualizing these atomic-scale rearrangements is critical for developing and refining models for how glasses bend, break, and melt. It is difficult, however, to directly image atomic motion in disordered solids. We demonstrate that using aberration-corrected transmission electron microscopy, we can excite and image atomic rearrangements in a two-dimensional silica glass-revealing a complex dance of elastic and plastic deformations, phase transitions, and their interplay. We identified the strain associated with individual ring rearrangements, observed the role of vacancies in shear deformation, and quantified fluctuations at a glass/liquid interface. These examples illustrate the wide-ranging and fundamental materials physics that can now be studied at atomic-resolution via transmission electron microscopy of two-dimensional glasses.
ABSTRACT
We present a unified theory of fracture in disordered brittle media that reconciles apparently conflicting results reported in the literature. Our renormalization group based approach yields a phase diagram in which the percolation fixed point, expected for infinite disorder, is unstable for finite disorder and flows to a zero-disorder nucleation-type fixed point, thus showing that fracture has a mixed first order and continuous character. In a region of intermediate disorder and finite system sizes, we predict a crossover with mean-field avalanche scaling. We discuss intriguing connections to other phenomena where critical scaling is only observed in finite size systems and disappears in the thermodynamic limit.
ABSTRACT
We study the asymptotic properties of fracture strength distributions of disordered elastic media by a combination of renormalization group, extreme value theory, and numerical simulation. We investigate the validity of the "weakest-link hypothesis" in the presence of realistic long-ranged interactions in the random fuse model. Numerical simulations indicate that the fracture strength is well-described by the Duxbury-Leath-Beale (DLB) distribution which is shown to flow asymptotically to the Gumbel distribution. We explore the relation between the extreme value distributions and the DLB-type asymptotic distributions and show that the universal extreme value forms may not be appropriate to describe the nonuniversal low-strength tail.
ABSTRACT
Motivated by recent experiments on the finite temperature Mott transition in VO(2) films, we propose a classical coarse-grained dielectric breakdown model where each degree of freedom represents a nanograin which transitions from insulator to metal with increasing temperature and voltage at random thresholds due to quenched disorder. We describe the properties of the resulting nonequilibrium metal-insulator transition and explain the universal characteristics of the resistance jump distribution. We predict that by tuning voltage, another critical point is approached, which separates a phase of boltlike avalanches from percolationlike ones.