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1.
J Microsc ; 217(Pt 2): 118-21, 2005 Feb.
Article in English | MEDLINE | ID: mdl-15683408

ABSTRACT

Electron backscatter diffraction on a scanning electron microscope has been utilized to acquire crystal orientation information around faceted fatigue cracks in a Co-Cr-Mo alloy for medical implants. The faceted fracture planes are unambiguously determined as {111} planes.


Subject(s)
Chromium Alloys , Equipment Failure Analysis , Microscopy, Electron, Scanning , Molybdenum , Crystallography , Prostheses and Implants
2.
J Microsc ; 217(Pt 2): 174-8, 2005 Feb.
Article in English | MEDLINE | ID: mdl-15683415

ABSTRACT

Al-Mg-Cu-Mn alloys have been developed for the packaging industry, in which large cold-working deformations are normally applied that can produce high dislocation densities. In this study, we present a simplified model for the yield strength contributions and apply that to obtain the dislocation densities by determining the orientation factors, which can be obtained via the crystal information of electron backscatter diffraction (EBSD). One alloy subjected to three cold-rolling reductions (10%, 40% and 90%) has been analysed by EBSD, and the density of dislocations are estimated using the strengthening model. This assessment suggests that dislocation densities by the Taylor model are roughly consistent but slightly lower than those determined by transmission electron microscopy.


Subject(s)
Alloys/chemistry , Microscopy, Electron, Scanning , Aluminum/chemistry , Cold Temperature , Copper/chemistry , Magnesium/chemistry , Manganese/chemistry , Stress, Mechanical
3.
J Microsc ; 211(Pt 2): 130-6, 2003 Aug.
Article in English | MEDLINE | ID: mdl-12887707

ABSTRACT

A simple analytical solution for the crystallographic orientation is described. This method is based on one indexed Kikuchi pair in a known zone rather than the corresponding diffraction spots. The accuracy of this method is shown to be better than 0.1 degrees even for cases in which a zone axis deviates by a large angle (e.g. 10 degrees ) from the centre of the beam direction. This approach simplifies experiments because only one pair of Kikuchi lines and a zone axis are needed, and is especially suited when it is difficult or cumbersome to resolve a second pair of Kikuchi lines with sufficient accuracy.

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