ABSTRACT
A discrepancy between the theories of volume and surface plasmon-polaritons (SPPs) wave scattering was found. Its tentative explanation is related to the resonance-like emission of SPPs energy due to SPPs diffraction by a surface relief Fourier decomposition component. It was also shown that the sum of surface wave scattered intensity along a plane of incidence is proportional to surface roughness value.
ABSTRACT
Angle-resolved scattering (ARS) intensities were measured in the backscattering hemisphere for the (1 0 0) and (1 1 1) faces of GaAs single crystals. Three epitaxial layers were deposited onto the GaAs (1 0 0) single-crystalline wafers. The laser elastic light scattering shows the presence of a regular surface microrelief whose orientation corresponds to the crystallographic axes in the surface plane. We studied the statistical properties of this microrelief and determined the parameters that characterize the surface. We propose to use the ARS ratio for two wavelengths (in our case, 632.8 and 441.6 nm) to determine the topographical properties of scattering and to study crystal surface defects.
ABSTRACT
Angular dependencies of the scattered light intensity were measured on Si wafers that have different crystallographic orientations by using a He-Ne laser (λ = 632.8 nm, 80 µm spot diameter). During the experiment the Si wafer was fixed relative to the incident beam. Regular patterns were found in the azimuthal-angle-resolved scattering curves. Such patterns seem to be caused by the faceted shallow atomic structures of the surface.
