ABSTRACT
Inversion analysis of transient absorption data to capture the photoexcited charge carrier population rate dynamics is a powerful technique for extracting realistic lifetimes and identifying recombination pathways. However, for highly scattering samples such as Cu2O nanoparticles (NPs) with associated dielectric Mie scattering, the scattering leads to an inaccurate measure of the excited photocarrier. This work studies methods to correct for the scattering to generalize the use of inversion analysis and provide secondary information about the nature of the scattering NPs. Scattering profiles of semitransparent disks containing Cu2O NPs with different shapes and sizes are measured to demonstrate that the inclusion of scattering in analysis reduces the photoexcited carrier density by 1 order of magnitude. It is found that the photocarrier density response is affected by shape rather than size. A Fourier transform of the scattering profiles produces a distribution of length scales within the sample characteristic of the mean separation of scatterers. This analysis reveals that NPs are forming clusters. Links are made between the scattering and carrier dynamics.
