Varietal Screening of Durum Wheat Varieties for Resistance to Pyrenophora tritici-repentis (Tan Spot) under Field Conditions.

Tan spot disease caused by Pyrenophora tritici-repentis was becoming more bred in Tunisia during the last decade. The search for resistant varieties against the increased virulence diversity of P. tritici-repentis is presently considered as a priority. Seven of the most commercialized durum wheat varieties in Tunisia (cvs. Maâli, Salim, Razzak, Monastir, Khiar, Inrat100, and Sculptur) were inoculated with five characterized fungal strains under field conditions, during two seasons. The variance analysis revealed that strains Ech8F6 and B4.8 used in inoculation are the most virulent ones. These strains hosting ToxB gene caused chlorosis symptom on the tested varieties. The other strains induced necrosis with yellow halo and host ToxA gene were less virulent. The area under disease progress curve values revealed that Maâli is the most vulnerable genotype compared to the new selected varieties Monastir and Inrat100. A variable tolerance rate of the varieties to tan spot disease was also highly visible on yield components. The losses were about 22.2% of the thousand kernel weight in Maâli variety, 35% of spikes/m2 in Inrat100 variety, 32.5% of kernel number/spike, and 25.2% of yield grain in Monastir variety. This effect evaluation of the strains harbouring ToxA and ToxB genes could be responsible for the identification of potentially susceptible genes Tsn1 and Tsc2 representing resistance sources for breeding programs.

Detection of Maternal and Cytoplasmic Effects on Resistance to Zymoseptoria tritici in Durum Wheat.

Septoria tritici blotch (STB) is a major disease problem of wheat worldwide. To optimize the introgression of resistance genes in elite genotypes throughout traditional or molecular breeding programs, a full understanding of the quantitative inheritance of resistance to Zymoseptoria tritici, plant height (PH), and thousand kernel weight (TKW) is needed. In this study, maternal and cytoplasmic effects of resistance to STB were investigated using P1 (susceptible, high-yielding line) and P2 (resistant, low-yielding line) durum wheat lines and their F1, RF1, F2, RF2, BC1, RBC1, BC2, and RBC2 progeny, assessed for resistance to STB during three growing seasons. Duncan mean's analysis revealed significant differences between generation means for STB, PH, and TKW. The two parents had an extreme pattern. The F1 and RF1 segregated close to their respective parents, suggesting the presence of cytoplasmic and maternal genetic effects for Z. tritici resistance, PH, and TKW. Separate generation mean's analysis confirmed the results of the Duncan test. A three-parameter model was found to be not adequate for all traits in all three growing years; while a digenic epistatic model with cytoplasmic or/and maternal effect was adequate for all cases. Narrow-sense heritability was in the range of 50-60%, 30-69%, and 28-31% for STB, PH, and TKW, respectively. For STB, high heritability and the presence of fixable epistatic effect is encouraging and could lead to creating varieties with the right female parent to exploit cytoplasmic and maternal effects in order to improve resistance to Z. tritici in durum wheat.