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Appl Opt ; 26(9): 1737-40, 1987 May 01.
Article in English | MEDLINE | ID: mdl-20454398

ABSTRACT

A powerful new technique is reported which enables realistic calculation of the optical energy gap of absorbing thin solid films by an analysis of measured transmittance and reflectance spectra in the fundamental absorption region. At the same time a new analytical method allows the thickness of films to be evaluated by measurements of transmittance only.

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