Magnetic Properties and Microstructure of FePt(BN, X, C) (X = Ag, Re) Films.

A sputtered FePt(BN, Re, C) film, here boron nitride (BN), was compared to a reference sample FePt(BN, Ag, C). Intrinsically, these films illustrate a high anisotropy field (Hk) and perpendicular magnetocrystalline anisotropy (Ku),although the reference sample shows a higher value (Hk = 69.5 kOe, Ku = 1.74 × 107 erg/cm3) than the FePt(BN, Re, C) film (Hk = 66.9 kOe, Ku = 1.46 × 107 erg/cm3). However, the small difference in the anisotropy constant (K2/K1) ratio presents a close tendency in the angular dependence of the switching field. Extrinsically, the out-of-plane coercivity for the reference sample is 32 kOe, which is also higher than the FePt(BN, Re, C) film (Hc = 27 kOe), and both films present lower remanence (Mr(parallel)/Mr(perpendicular) = 0.08~0.12), that is, the index for perpendicular magnetic anisotropy. The higher perpendicular magnetization for both films was due to highly (001) textured FePt films, which was also evidenced by the tight rocking width of 4.1°/3.0° for (001)/(002) X-ray diffraction peaks, respectively, and high-enough ordering degree. The reference sample was measured to have a higher ordering degree (S = 0.84) than FePt(BN, Re, C) (S = 0.63). As a result, the Ag segregant shows stronger ability to promote the ordering of the FePt film; however, the FePt(BN, Re, C) film still has comparable magnetic properties without Ag doping. From the surface and elemental composition analysis, the metallic Re atoms found in the FePt lattice result in a strong spin-orbital coupling between transition metal Fe (3d electron) and heavy metals (Re, Pt) (5d electron) and we conducted high magnetocrystalline anisotropy (Ku). Above is the explanation that the lower-ordered FePt(BN, Re, C) film still has high-enough Ku and out-of-plane Hc. Regarding the microstructure, both the reference sample and FePt(BN, Re, C) show granular structure and columnar grains, and the respective average grain size and distributions are 6.60 nm (12.5%) and 11.2 nm (15.9%). The average widths of the grain boundaries and the aspect ratio of the columnar grain height are 2.05 nm, 1.00 nm, 2.35 nm, and 1.70 nm, respectively.

Switching Field Distribution in BN/FePtCAg/MgTiON and FePtCAg/MgTiOBN Films.

BN is the currently required segregant for perpendicular FePt media. We found that BN can be diffused from the MgTiOBN intermediate layer during a high temperature process. The FePtCAg film sputtered on MgTiOBN layers illustrates higher perpendicular magnetocrystalline anisotropy (Ku) (1.43 × 107 erg/cm3) and coercivity (normal to film surface) (17 kOe) at 350 K compared to BN/FePtCAg/MgTiON film. From the microstructure, the FePtCAg film shows the granular structure on the MgTiOBN intermediate layer, but parts of the irregular FePt grains are agglomerated and partially separated in the matrix, with grains size being, on average, 26.7 nm. Cross-sectional imaging showed that the FePt grains have a truncated pyramid shape with a lower wetting angle, which is influenced by the surface energy of MgTiOBN. BN segregation at FePt grains or boundaries is still not clear. Using the electron energy loss spectrum (EELS), we found that part of the BN atoms were clearly observed in the FePt lattice and iron-boride oxide was indexed in the x-ray photoelectron spectroscopy (XPS) spectra. To determine the effects of BN segregant (from capping layer or intermediate layer) on the magnetic switching behavior of FePtCAg film, the intrinsic-(ΔHint = 6.17 kOe, 6.54 kOe) and extrinsic- (ΔHext = 0.80 kOe, 0.39 kOe) switching field distribution (SFD) were measured by plotting saturated major- and unsaturated minor- hysteresis loops to evaluate the crystal orientation and microstructure (grains volume and distribution) for BN/FePtCAg/MgTiON and FePtCAg/MgTiOBN films, respectively. The main contribution of intrinsic SFD is the c-axis misalignment for the BN/FePt/MgTiON sample; however, the dispersed magnetic anisotropy has a higher input to intrinsic SFD for FePtCAg/MgTiOBN/CrRu film.

Temperature Dependence and Microstructure Effects on Magnetic Properties of FePt(B, Ag, C) Film.

A FePt(B, Ag, C) granular film was formed from post-annealed B4C(1.0 nm)/FePt(Ag, C) layers at a substrate temperature of 470 °C for 2 min. The 6 nm thick FePt(B, Ag, C) film demonstrates high perpendicular magnetic anisotropy (Ku = 2.83 × 107 erg/cm3 at 100 K) and out-of-plane coercivity (Hc = 38.0 kOe at 100 K). The Ku and out-of-plane Hc are respectively increased from 38% and 46% between 350 K and 50 K. The sample with a thickness of 8 nm also shows a similar trend for magnetic properties; however, the tiny magnetization kink which may come from rare Fe-B or disordered FePt grains was observed in the easy axis loop. The intrinsic (ΔHint = 12.6 kOe) and extrinsic switching field distribution (ΔHext = 1.62 kOe) were characterized by major and minor loops to correlate the microstructural grains. The coupled FePt grains grown on a single MgTiON grain were observed in a high-resolution transmission electron microstructure (HRTEM) image. This small intergranular exchange coupling was defined by estimating the magnetic cluster size (46.6 nm) from ΔHext and the average grains size (28.2 nm) from TEM images. The temperature dependence of coercivity was fitted to further understand the magnetization reversal process. The lower microstructural parameter was evidenced in the imperfect grain morphology.

Nonlinear dependence between the surface reflectance and the duty-cycle of semiconductor nanorod array.

The nonlinear dependence between the duty-cycle of semiconductor nanorod array and its surface reflectance minimization is demonstrated. The duty-cycle control on thin-SiO2 covered Si nanorod array is performed by O(2-) plasma pre-etching the self-assembled polystyrene nanosphere array mask with area density of 4 × 10(8) rod/cm(-2). The 120-nm high SiO2 covered Si nanorod array is obtained after subsequent CF4/O2 plasma etching for 160 sec. This results in a tunable nanorod diameter from 445 to 285 nm after etching from 30 to 80 sec, corresponding to a varying nanorod duty-cycle from 89% to 57%. The TM-mode reflection analysis shows a diminishing Brewster angle shifted from 71° to 54° with increasing nanorod duty-cycle from 57% to 89% at 532 nm. The greatly reduced small-angle reflectance reveals a nonlinear trend with enlarging duty-cycle, leading to a minimum surface reflectance at nanorod duty-cycle of 85%. Both the simulation and experiment indicate that such a surface reflectance minimum is even lower than that of a uniformly SiO2 covered Si substrate on account of its periodical nanorod array architecture with tuned duty-cycle.

Magnetic viscosity and microstructure of GePt/FePt films.

We found various GePt/FePt microstructures at different post-annealing temperatures. The Ge(2)Pt(3) compound was formed when the annealing temperature was 800 °C and the particle-like structure was able to relax the growth stress between Ge(2)Pt(3) and quartz. After deposition of FePt film, a discontinuous L1(0) FePt layer was formed when it was post-annealed at 400 °C. However, isolated L1(0) FePt particles were observed at 800 °C post-annealing temperature, and each particle contains many grains. Furthermore, the magnetic viscosity was measured to investigate the different GePt/FePt morphology effects on thermal activation behaviour. When the applied field was less than the coercivity field H(c), we found smaller activation volume (V(a) = 0.5 × 10(-18) cm(3)) for a film with 400 °C post-annealing. This is because smaller FePt grains are in between GePt islands and the moments in these grains are hard to reverse. In contrast, a larger V(a) (= 1.9 × 10(-18) cm(3)) was found in samples post-annealed at 600-800 °C. This is because the GePt islands agglomerate to become particle-like at high temperature and larger FePt grains were distributed on each GePt particle.