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Rev Sci Instrum ; 79(1): 016102, 2008 Jan.
Article in English | MEDLINE | ID: mdl-18248074

ABSTRACT

We demonstrate a high-brightness compact 9 keV electron-impact microfocus x-ray source based on a liquid-gallium-jet anode. A approximately 30 W, 50 kV electron gun is focused onto the approximately 20 ms, 30 mum diameter liquid-gallium-jet anode to produce an approximately 10 microm full width at half maximum x-ray spot. The peak spectral brightness is >2 x 10(10) photons(s mm(2) mrad(2)x0.1% BW). Calculation and experiments show potential for increasing this brightness by approximately three orders of magnitude, making the source suitable for laboratory-scale x-ray crystallography and hard x-ray microscopy.


Subject(s)
Electrons , Gallium/radiation effects , Synchrotrons/instrumentation , Equipment Design , Equipment Failure Analysis , Reproducibility of Results , Sensitivity and Specificity , Solutions , X-Rays
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