High-precision orientation mapping from spherical harmonic transform indexing of electron backscatter diffraction patterns.

The angular precision of crystal orientation determination by cross-correlating dynamically simulated electron diffraction patterns with experimental patterns via spherical harmonic analysis is investigated. The best precision found in this study is 0.016°, which approaches the level reported in the literature for other high-precision electron backscatter diffraction implementations. At this angular precision, the noise floor for geometrically necessary dislocation density calculations is found to be approximately 5×1013 m-2 at a 200 nm step size. Conventional Hough-transform indexing of the same raw patterns gave an angular precision of 0.156° and a dislocation noise floor of 6×1014 m-2, an order of magnitude larger for both parameters, albeit better than is typical for Hough indexing due to the high-quality patterns used. Experimental trade-off curves of precision versus exposure time, pattern resolution (i.e. camera binning), and analysis bandwidth are also presented, allowing for optimization of data collection and analysis rates once the desired level of precision has been determined.

Quasi-periodic events in crystal plasticity and the self-organized avalanche oscillator.

When external stresses in a system--physical, social or virtual--are relieved through impulsive events, it is natural to focus on the attributes of these avalanches. However, during the quiescent periods between them, stresses may be relieved through competing processes, such as slowly flowing water between earthquakes or thermally activated dislocation flow between plastic bursts in crystals. Such smooth responses can in turn have marked effects on the avalanche properties. Here we report an experimental investigation of slowly compressed nickel microcrystals, covering three orders of magnitude in nominal strain rate, in which we observe unconventional quasi-periodic avalanche bursts and higher critical exponents as the strain rate is decreased. Our experiments are faithfully reproduced by analytic and computational dislocation avalanche modelling that we have extended to incorporate dislocation relaxation, revealing the emergence of the self-organized avalanche oscillator: a novel critical state exhibiting oscillatory approaches towards a depinning critical point. This theory suggests that whenever avalanches compete with slow relaxation--in settings ranging from crystal microplasticity to earthquakes--dynamical quasi-periodic scale invariance ought to emerge.

Stencil mask methodology for the parallelized production of microscale mechanical test samples.

A new methodology to parallelize the production of micromechanical test samples from bulk materials is reported. This methodology has been developed to produce samples with typical gage dimensions on the order of 20-200 µm, and also to minimize the reliance on conventional focused ion beam fabrication methods. The fabrication technique uses standard microelectronic process methods such as photolithography and deep-reactive ion etching to create high aspect ratio patterned templates-stencil masks-from a silicon wafer. In the present work, the stencil mask pattern consists of a linear row of tensile samples, where one grip of each sample is integrally attached to the bulk substrate. Once fabricated, the stencil mask is placed on top of a pre-thinned substrate, and the pattern and substrate are co-sputtered using a broad ion beam milling system, which ultimately results in the transfer of the mask pattern into the substrate. The methodology is demonstrated using a Si stencil mask and a polycrystalline Ni foil to manufacture an array of metallic micro-tensile samples.

Electron channeling: a problem for x-ray microanalysis in materials science.

Electron channeling effects can create measurable signal intensity variations in all product signals that result from the scattering of the electron beam within a crystalline specimen. Of particular interest to the X-ray microanalyst are any variations that occur within the characteristic X-ray signal that are not directly related to a specimen composition variation. Many studies have documented the effect of crystallographic orientation on the local X-ray yield; however, the vast majority of these studies were carried out on thin foil specimens examined in transmission. Only a few studies have addressed these effects in bulk specimen materials, and these analyses were generally carried out at common scanning electron microscope microanalysis overvoltages (>1.5). At these overvoltage levels, the anomalous transmission effect is weak. As a result, the effect of electron channeling on the characteristic X-ray signal intensity has traditionally been overlooked in the field of quantitative electron probe microanalysis. The present work will demonstrate that electron channeling can produce X-ray variations of up to 26%, between intensity maxima and minima, in low overvoltage X-ray microanalyses of bulk specimens. Intensity variations of this magnitude will significantly impact the accuracy of qualitative and quantitative X-ray microanalyses at low overvoltage on engineering structural materials.

Scale-free intermittent flow in crystal plasticity.

Under stress, crystals irreversibly deform through complex dislocation processes that intermittently change the microscopic material shape through isolated slip events. These underlying processes can be revealed in the statistics of the discrete changes. Through ultraprecise nanoscale measurements on nickel microcrystals, we directly determined the size of discrete slip events. The sizes ranged over nearly three orders of magnitude and exhibited a shock-and-aftershock, earthquake-like behavior over time. Analysis of the events reveals power-law scaling between the number of events and their magnitude, or scale-free flow. We show that dislocated crystals are a model system for studying scale-free behavior as observed in many macroscopic systems. In analogy to plate tectonics, smooth macroscopic-scale crystalline glide arises from the spatial and time averages of disruptive earthquake-like events at the nanometer scale.

Sample dimensions influence strength and crystal plasticity.

When a crystal deforms plastically, phenomena such as dislocation storage, multiplication, motion, pinning, and nucleation occur over the submicron-to-nanometer scale. Here we report measurements of plastic yielding for single crystals of micrometer-sized dimensions for three different types of metals. We find that within the tests, the overall sample dimensions artificially limit the length scales available for plastic processes. The results show dramatic size effects at surprisingly large sample dimensions. These results emphasize that at the micrometer scale, one must define both the external geometry and internal structure to characterize the strength of a material.