ABSTRACT
Isotope imaging is commonly used to investigate the localization of trace elements and their isotopes. In situ noble gas analysis of meteorites revealed the distribution of primordial noble gases that were trapped in the building blocks of asteroids and planets during the early stage of the solar system evolution. Solar wind noble gases are among the primordial gases present in meteorites and were trapped through exposure to solar wind. Micrometer-resolution in situ noble gas analysis has not been achieved due to the lack of sensitivity and spatial resolution. The microscale imaging technique is crucial for identifying the carrier phase of the solar wind noble gases. We have developed 4He isotope imaging utilizing secondary neutral mass spectrometry with strong field postionization. This technique achieved a lateral resolution of 2 µm and a 4He detection limit of 2 × 1017 cm-3. This development allows for the study of a solar wind gas-rich meteorite, Northwest Africa 801 carbonaceous chondrite, with micrometer resolution. The solar wind 4He carriers are fine-grained particles and are sparsely scattered in the matrix region.
ABSTRACT
Time-resolved two-dimensional (2D) profiles of electron density (n e) and electron temperature (T e) of extreme ultraviolet (EUV) lithography light source plasmas were obtained from the ion components of collective Thomson scattering (CTS) spectra. The highest EUV conversion efficiency (CE) of 4% from double pulse lasers irradiating a Sn droplet was obtained by changing their delay time. The 2D-CTS results clarified that for the highest CE condition, a hollow-like density profile was formed, i.e., the high density region existed not on the central axis but in a part with a certain radius. The 2D profile of the in-band EUV emissivity (ηEUV) was theoretically calculated using the CTS results and atomic model (Hullac code), which reproduced a directly measured EUV image reasonably well. The CTS results strongly indicated the necessity of optimizing 2D plasma profiles to improve the CE in the future.
ABSTRACT
A new system incorporating a multi-turn time-of-flight secondary ion/sputtered neutral mass spectrometer (TOF-SIMS/SNMS) with laser post-ionization was designed and constructed. This system consists of a gallium focused ion beam, femtosecond (fs) laser for post-ionization, and multi-turn TOF mass spectrometer. When laser post-ionization was used, the secondary ion signal strengths for several metals increased by up to 650 times, and were greater than the values obtained in conventional TOF-SIMS experiments. Use of the multi-turn mass spectrometer resulted in an increase in mass resolving power with increase in the total TOF. The mass resolving power reached to 23,000 after 800 multi-turn cycles, corresponding to a flight path length of 1040 m. These results indicated that this system is very effective for the analysis of valuable materials such as space samples with high sensitivity, high mass resolving power, and high lateral resolution.
