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Braz Dent J ; 29(2): 208-213, 2018.
Article in English | MEDLINE | ID: mdl-29898070

ABSTRACT

The aim of the present study was to evaluate the cyclic fatigue of two anatomic finishing files: XP-Endo Finisher and XP-Clean. Roughness pattern and the micro-hardness of the files were also assessed. Instruments were subjected to cyclic fatigue resistance measuring the time to fracture in an artificial stainless-steel canal with a 60° angle and a 5-mm radius of curvature. The fracture surface of all fragments was examined with a scanning electron microscope. The roughness of the working parts was quantified by using a profilometer and the micro-hardness test was carried out using a Vickers hardness tester. Results were statistically analyzed using a student´s t-test at a significance level of P < 0.05. Weibull analysis was also performed. XP-Endo Finisher presented significantly longer cyclic fatigue life than XP-Clean instruments (P<0.05). XP-Endo Finisher was able to withstand 1000% more cycles to fracture when compared to XP-Clean instruments. SEM visual inspection of the fracture surfaces revealed fractographic characteristics of ductile fracture in all tested instruments; wide-ranging forms of dimples were identified and no plastic deformation in the helical shaft of the fractured instruments was observed. When mean life was compared XP-Endo Finisher lasted longer than XP-Clean with a probability of 99.9%. XP-Endo Finisher instruments also exhibited significantly lower roughness than XP-Clean instruments (P<0.05). No differences in the micro-hardness was observed between the files (P>0.05). It can be concluded that XP-Endo Finisher instruments showed improved performance when compared with XP-Clean instruments, demonstrating higher cyclic fatigue resistance and lower roughness.


Subject(s)
Dental Instruments , Materials Testing , Root Canal Preparation/instrumentation , Alloys , Hardness Tests , Microscopy, Electron, Scanning , Nickel/chemistry , Stainless Steel/chemistry , Surface Properties , Titanium/chemistry
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