ABSTRACT
The study of materials for space exploration is one of the most interesting targets of international space agencies. An essential tool for realizing light junctions is epoxy adhesive (EA), which provides an elastic and robust material with a complex mesh of polymeric chains and crosslinks. In this work, a study of the structural and chemical modification of a commercial two-part flexible EA (3M™ Scotch-Weld™ EC-2216 B/A Gray), induced by 60Co gamma radiation, is presented. Combining different spectroscopic techniques, such as the spectroscopic Fourier transform infrared spectroscopy (FTIR), the THz time-domain spectroscopy (TDS), and the electron paramagnetic resonance (EPR), a characterization of the EA response in different regions of the electromagnetic spectrum is performed, providing valuable information about the structural and chemical properties of the polymers before and after irradiation. A simultaneous dissociation of polymeric chain and crosslinking formation is observed.The polymer is not subject to structural modification at an absorbed dose of 10 kGy, in which only transient free radicals are observed. Differently, between 100 and 500 kGy, a gradual chemical degradation of the samples is observed together with a broad and long-living EPR signal appearance. This study also provides a microscopic characterization of the material useful for the mechanism evaluation of system degradation.
ABSTRACT
Nowadays, a wide number of applications based on magnetic materials rely on the properties arising at the interface between different layers in complex heterostructures engineered at the nanoscale. In ferromagnetic/heavy metal multilayers, such as the [Co/Pt]N and [Co/Pd]N systems, the magnetic proximity effect was demonstrated to be asymmetric, thus inducing a magnetic moment on the Pt (Pd) layer that is typically higher at the top Co/Pt(Pd) interface. In this work, advanced spectroscopic and imaging techniques were combined with theoretical approaches to clarify the origin of this asymmetry both in Co/Pt trilayers and, for the first time, in multilayer systems that are more relevant for practical applications. The different magnetic moment induced at the Co/Pt interfaces was correlated to the microstructural features that are in turn affected by the growth processes that induce a different intermixing during the film deposition, thus influencing the interface magnetic profile.
ABSTRACT
The electronic phase behavior and functionality of interfaces and surfaces in complex materials are strongly correlated to chemical composition profiles, stoichiometry and intermixing. Here a novel analysis scheme for resonant X-ray reflectivity maps is introduced to determine such profiles, which is element specific and non-destructive, and which exhibits atomic-layer resolution and a probing depth of hundreds of nanometers.
