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1.
Tunneling in all-high-Tc edge junctions with deposited barriers.
Laibowitz RB; Robertazzi RP; Koch RH; Kleinsasser A; Kirtley JR; Viggiano JM; Sandstrom RL; Gallagher WJ.
Phys Rev B Condens Matter ; 46(22): 14830-14833, 1992 Dec 01.
Article in English | MEDLINE | ID: mdl-10003582
2.
Gefen et al. respond.
Gefen Y; Shih WH; Laibowitz RB; Viggiano JM.
Phys Rev Lett ; 58(25): 2727, 1987 Jun 22.
Article in English | MEDLINE | ID: mdl-10034830
3.
Nonlinear behavior near the percolation metal-insulator transition.
Gefen Y; Shih WH; Laibowitz RB; Viggiano JM.
Phys Rev Lett ; 57(24): 3097-3100, 1986 Dec 15.
Article in English | MEDLINE | ID: mdl-10033953
4.
Resistivity-noise measurements in thin gold films near the percolation threshold.
Koch RH; Laibowitz RB; Alessandrini EI; Viggiano JM.
Phys Rev B Condens Matter ; 32(10): 6932-6935, 1985 Nov 15.
Article in English | MEDLINE | ID: mdl-9936814
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