ABSTRACT
Volumetric imaging with high spatiotemporal resolution is of utmost importance for various applications ranging from aerospace and defense to real-time imaging of dynamic biological processes. To facilitate three-dimensional sectioning, current technology relies on mechanisms to reject light from adjacent out-of-focus planes either spatially or by other means. Yet, the combination of rapid acquisition time and high axial resolution is still elusive, motivating a persistent pursuit for emerging imaging approaches. Here we introduce and experimentally demonstrate a concept named spectrally gated microscopy (SGM), which enables a single-shot interrogation over the full axial dimension while maintaining a submicron sectioning resolution. SGM utilizes two important features enabled by flat optics (i.e., metalenses or diffractive lenses), namely, a short focal length and strong chromatic aberrations. Using SGM we demonstrate three-dimensional imaging of millimeter-scale samples while scanning only the lateral dimension, presenting a significant advantage over state-of-the-art technology.