Multi-element isotopic analysis of hot particles from Chornobyl.

Microscopic fuel fragments, so-called "hot particles", were released during the 1986 accident at the Chornobyl nuclear powerplant and continue to contaminate the exclusion zone in northern Ukraine. Isotopic analysis can provide vital information about sample origin, history and contamination of the environment, though it has been underutilized due to the destructive nature of most mass spectrometric techniques, and inability to remove isobaric interference. Recent developments have diversified the range of elements that can be investigated through resonance ionization mass spectrometry (RIMS), notably in the fission products. The purpose of this study is to demonstrate the application of multi-element analysis on hot particles as relates to their burnup, particle formation in the accident, and weathering. The particles were analysed with two RIMS instruments: resonant-laser secondary neutral mass spectrometry (rL-SNMS) at the Institute for Radiation Protection and Radioecology (IRS) in Hannover, Germany, and laser ionization of neutrals (LION) at Lawrence Livermore National Laboratory (LLNL) in Livermore, USA. Comparable results across instruments show a range of burnup dependent isotope ratios for U and Pu and Cs, characteristic of RBMK-type reactors. Results for Rb, Ba and Sr show the influence of the environment, retention of Cs in the particles and time passed since fuel discharge.

An overview of NRL's NAUTILUS: a combination SIMS-AMS for spatially resolved trace isotope analysis.

We present a description of the capabilities and performance of the NAval Ultra-Trace Isotope Laboratory's Universal Spectrometer (NAUTILUS) at the U.S. Naval Research Laboratory. The NAUTILUS combines secondary ion mass spectrometry (SIMS) and single-stage accelerator mass spectrometry (SSAMS) into a single unified instrument for spatially resolved trace element and isotope analysis. The NAUTILUS instrument is essentially a fully functional SIMS instrument with an additional molecule-filtering detector, the SSAMS. The combination of these two techniques mitigates the drawbacks of each and enables new measurement paradigms for SIMS-like microanalysis. Highlighted capabilities include molecule-free raster ion imaging for direct spatially resolved analysis of heterogeneous materials with or without perturbed isotopic compositions. The NAUTILUS' sensitivity to trace elements is at least 10× better than commercial SIMS instruments due to near-zero background conditions. We describe the design and construction of the NAUTILUS, and its performance applied to topics in nuclear materials analysis, cosmochemistry, and geochemistry.

U-Pu Mixed Oxide Particle Analysis by NAUTILUS and Implications for Next-Generation Verification Challenges.

Precise and accurate measurement of U and Pu isotopes from micrometer-sized particles represents new verification challenges for the International Atomic Energy Agency. The U and Pu isotopes and U-Pu elemental ratio provide valuable information about the intended use, the production process, and the purification process of Pu and mixed oxide (MOX) fuels. We demonstrate the ability to directly measure U and Pu isotopes from MOX fuel particles using the U.S. Naval Research Laboratory's Naval Ultra-Trace Isotope Laboratory's Universal Spectrometer (NAUTILUS). Reactor-grade MOX reference materials with well-characterized U and Pu isotopic composition (e.g., UKMOX10 and UKMOX100) were prepared using standard sample preparation methods for large geometry-secondary ion mass spectrometry (LG-SIMS). The results show that the NAUTILUS can discriminate the 238U1H+ signal from 239Pu+, enabling the accurate measurement of the 240Pu/239Pu ratio for MOX particles within 2σ of the certificate value for U-Pu ratios from 3:1 to 300:1. The accuracy of previously reported LG-SIMS measurements was limited to U-Pu ratios <15:1. Using the NAUTILUS, the 234U/238U, 235U/238U, 236U/238U, 240Pu/239Pu, and 242Pu/239Pu ratios for UKMOX10 and UKMOX100 can all be measured accurately within 2σ of the reference values, directly, without correction. The application of the NAUTILUS to the accurate and precise determination of the elemental and isotopic composition of MOX particles in environmental samples may unravel some emerging verification challenges in international safeguards.

Discovery of fissionogenic Cs and Ba capture five years after Oklo reactor shutdown.

Understanding the release and sequestration of specific radioactive signatures into the environment is of extreme importance for long-term nuclear waste storage and reactor accident mitigation. Recent accidents at the Fukushima and Chernobyl nuclear reactors released radioactive 137Cs and 134Cs into the environment, the former of which is still live today. We have studied the migration of fission products in the Oklo natural nuclear reactor using an isotope imaging capability, the NAval Ultra-Trace Isotope Laboratory's Universal Spectrometer (NAUTILUS) at the US Naval Research Laboratory. In Oklo reactor zone (RZ) 13, we have identified the most depleted natural U of any known material with a 235U/238U ratio of 0.3655 ± 0.0007% (2σ). This sample contains the most extreme natural burnup in 149Sm, 151Eu, 155Gd, and 157Gd, which demonstrates that it was sourced from the most active Oklo reactor region. We have discovered that fissionogenic Cs and Ba were captured by Ru metal/sulfide aggregates shortly following reactor shutdown. Isochrons from the Ru aggregates place their closure time at 4.98 ± 0.56 y after the end of criticality. Most fissionogenic 135Ba and 137Ba in the Ru migrated and was incorporated as Cs over this period. Excesses in 134Ba in the Ru point to the burnup of 133Cs. Cesium and Ba were retained in the Ru despite local volcanic activity since the reactor shutdown and the high level of activity during reactor operation.

Fully convolutional neural network for removing background in noisy images of uranium bearing particles.

A fully convolutional neural network (FCN) was developed to supersede automatic or manual thresholding algorithms used for tabulating SIMS particle search data. The FCN was designed to perform a binary classification of pixels in each image belonging to a particle or not, thereby effectively removing background signal without manually or automatically determining an intensity threshold. Using 8000 images from 28 different particle screening analyses, the FCN was trained to accurately predict pixels belonging to a particle with near 99% accuracy. Background eliminated images were then segmented using a watershed technique in order to determine isotopic ratios of identified particles. A comparison of the isotopic distributions of an independent data set segmented using the neural network with a commercially available automated particle measurement (APM) program developed by CAMECA was performed. This comparison highlighted the necessity for effective background removal to ensure that resulting particle identification is not only accurate, but preserves valuable signal that could be lost due to improper segmentation. The FCN approach improves the robustness of current state-of-the-art particle searching algorithms by reducing user input biases, resulting in an improved absolute signal per particle and decreased uncertainty of the determined isotope ratios.

Nanotome cluster bombardment to recover spatial chemistry after preparation of biological samples for SIMS imaging.

A C(60)(+) cluster ion projectile is employed for sputter cleaning biological surfaces to reveal spatio-chemical information obscured by contamination overlayers. This protocol is used as a supplemental sample preparation method for time of flight secondary ion mass spectrometry (ToF-SIMS) imaging of frozen and freeze-dried biological materials. Following the removal of nanometers of material from the surface using sputter cleaning, a frozen-patterned cholesterol film and a freeze-dried tissue sample were analyzed using ToF-SIMS imaging. In both experiments, the chemical information was maintained after the sputter dose, due to the minimal chemical damage caused by C(60)(+) bombardment. The damage to the surface produced by freeze-drying the tissue sample was found to have a greater effect on the loss of cholesterol signal than the sputter-induced damage. In addition to maintaining the chemical information, sputtering is not found to alter the spatial distribution of molecules on the surface. This approach removes artifacts that might obscure the surface chemistry of the sample and are common to many biological sample preparation schemes for ToF-SIMS imaging.

Freeze-etching and vapor matrix deposition for ToF-SIMS imaging of single cells.

Freeze-etching, the practice of removing excess surface water from a sample through sublimation into the vacuum of the analysis environment, has been extensively used in conjunction with electron microscopy. Here, we apply this technique to time-of-flight secondary-ion mass spectrometry (ToF-SIMS) imaging of cryogenically preserved single cells. By removing the excess water which condenses onto the sample in vacuo, a uniform surface is produced that is ideal for imaging by static SIMS. We demonstrate that the conditions employed to remove deposited water do not adversely affect cell morphology and do not redistribute molecules in the topmost surface layers. In addition, we found water can be controllably redeposited onto the sample at temperatures below -100 degrees C in vacuum. The redeposited water increases the ionization of characteristic fragments of biologically interesting molecules 2-fold without loss of spatial resolution. The utilization of freeze-etch methodology will increase the reliability of cryogenic sample preparations for SIMS analysis by providing greater control of the surface environment. Using these procedures, we have obtained high quality spectra with both atomic bombardment as well as C 60 (+) cluster ion bombardment.

The effect of incident angle on the C(60) bombardment of molecular solids.

The effect of incident angle on the quality of SIMS molecular depth profiling using C(60) (+) was investigated. Cholesterol films of ~300 nm thickness on Si were employed as a model and were eroded using 40 keV C(60) (+) at an incident angle of 40° and 73° with respect to the surface normal. The erosion process was characterized by determining at each angle the relative amount of chemical damage, the total sputtering yield of cholesterol molecules, and the interface width between the film and the Si substrate. The results show that there is less molecule damage at an angle of incidence of 73° and that the total sputtering yield is largest at an angle of incidence of 40°. The measurements suggest reduced damage is not necessarily dependent upon enhanced yields and that depositing the incident energy nearer the surface by using glancing angles is most important. The interface width parameter supports this idea by indicating that at the 73° incident angle, C(60) (+) produces a smaller altered layer depth. Overall, the results show that 73° incidence is the better angle for molecular depth profiling using 40 keV C(60) (+).