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Ultramicroscopy
; 186: 18-22, 2018 03.
Article
in English
| MEDLINE
| ID: mdl-29245031
ABSTRACT
We have developed and characterized a plasmon-excitation scattering-type near-field scanning optical microscope with sharpened single carbon nanotube probe. The developed microscope can optically capture differences in the refractive index of single-nanometer surface structures. Statistical analysis enabled us to estimate the precision of the optical length measurement to 1.8â¯nm.