1.
Opt Express
; 19(18): 17226-31, 2011 Aug 29.
Article
in English
| MEDLINE
| ID: mdl-21935086
ABSTRACT
We show that reflectivity measurements enable the determination of the thickness of multilayered graphene on a metal substrate. The developed technique is based on comparison of the substrate reflectance with and without graphene and relies on the strong absorbance of graphene and high refractive index contrast. We demonstrate the technique by measuring the thickness of the CVD graphene film grown on a copper substrate.