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Similar point defects in crystalline and amorphous silicon.

Liang ZN; Niesen L; van den Hoven GN; Custer JS.

Phys Rev B Condens Matter ; 49(23): 16331-16337, 1994 Jun 15.

Article in English | MEDLINE | ID: mdl-10010782

van den Hoven et al. reply.

van den Hoven GN; Liang ZN; Niesen L; Custer JS.

Phys Rev Lett ; 70(14): 2197, 1993 Apr 05.

Article in English | MEDLINE | ID: mdl-10053497

Evidence for vacancies in amorphous silicon.

van den Hoven GN; Liang ZN; Niesen L; Custer JS.

Phys Rev Lett ; 68(25): 3714-3717, 1992 Jun 22.

Article in English | MEDLINE | ID: mdl-10045778

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