Model based fitting of pattern reversal visually evoked potentials provides a reliable characterization of waveform components.

Objective: To introduce a novel approach to analyzing pattern reversal visual evoked potentials (prVEPs) using a difference-of-gammas model-based fitting method. Methods: prVEP was recorded from uninjured youth ages 11-19 years during pre- or postseason sports evaluation. A difference-of-gammas model fit was used to extract the amplitude, peak time, and peak width of each of four gamma components. The within session reliability and stability of fits across a 6-month period were determined. To demonstrate an application of this analysis, changes in parameters across age were determined. Results: A difference-of-gammas model consisting of four gamma functions was fit to the prVEP of 151 youth. Peak times and amplitudes of functions corresponded to standard measures of the N75, P100, and N135 components respectively, and a late gamma peak (mean peak time 219 ms). We extracted the peak width, which increased with each subsequent temporal peak. Parameter fits were reliable within sessions (correlation coefficient >0.92 for all measured parameters; good agreement on Bland-Altman calculation) and were stable between sessions separated by less than 6 months (correlation coefficient > 0.90). Standard peak analysis metrics extracted from the difference-of-gamma model fits were largely consistent with gold-standard peak analysis measurements. Conclusions: The difference-of-gammas model provides a stable and reliable within-participant representation of the global temporal variability of prVEP waveforms across a large sample of youth. Significance: Using difference-of-gammas model to characterize the global temporal variability of the prVEP waveform offers a promising direction to enhance analysis for identifying and following subtle changes in neurologic conditions.

StatSTEM: An efficient approach for accurate and precise model-based quantification of atomic resolution electron microscopy images.

An efficient model-based estimation algorithm is introduced to quantify the atomic column positions and intensities from atomic resolution (scanning) transmission electron microscopy ((S)TEM) images. This algorithm uses the least squares estimator on image segments containing individual columns fully accounting for overlap between neighbouring columns, enabling the analysis of a large field of view. For this algorithm, the accuracy and precision with which measurements for the atomic column positions and scattering cross-sections from annular dark field (ADF) STEM images can be estimated, has been investigated. The highest attainable precision is reached even for low dose images. Furthermore, the advantages of the model-based approach taking into account overlap between neighbouring columns are highlighted. This is done for the estimation of the distance between two neighbouring columns as a function of their distance and for the estimation of the scattering cross-section which is compared to the integrated intensity from a Voronoi cell. To provide end-users this well-established quantification method, a user friendly program, StatSTEM, is developed which is freely available under a GNU public license.