Continuous every-single-shot carrier-envelope phase measurement and control at 100 kHz.

With the emergence of high-repetition-rate few-cycle laser pulse amplifiers aimed at investigating ultrafast dynamics in atomic, molecular, and solid-state science, the need for ever faster carrier-envelope phase (CEP) detection and control has arisen. Here we demonstrate a high-speed, continuous, every-single-shot measurement and fast feedback scheme based on a stereo above-threshold ionization time-of-flight spectrometer capable of detecting the CEP and pulse duration at a repetition rate of up to 400 kHz. This scheme is applied to a 100 kHz optical parametric chirped pulse amplification few-cycle laser system, demonstrating improved CEP stabilization and allowing for CEP tagging.

Single-shot, real-time carrier-envelope phase measurement and tagging based on stereographic above-threshold ionization at short-wave infrared wavelengths.

A high-precision, single-shot, and real-time carrier-envelope phase (CEP) measurement at 1.8 µm laser wavelength based on stereographic photoelectron spectroscopy is presented. A precision of the CEP measurement of 120 mrad for each and every individual laser shot for a 1 kHz pulse train with randomly varying CEP is demonstrated. Simultaneous to the CEP measurement, the pulse lengths are characterized by evaluating the spatial asymmetry of the measured above-threshold ionization (ATI) spectra of xenon and referenced to a standard pulse-duration measurement based on frequency-resolved optical gating. The validity of the CEP measurement is confirmed by implementing phase tagging for a CEP-dependent measurement of ATI in xenon with high energy resolution.