RESUMEN
The alloy composition dependence of penetration range and backscattering coefficient of electrons normally impinging on SixGe1-x and GaAsxN1-x semiconductor alloys targets for beam energies in the range 0.5-3.5â¯keV has been investigated. The electron penetration range is calculated using the Ashley's model. The electron backscattering coefficient is determined using both the Vicanek and Urbassek theory where the transport cross-sections are obtained more accurately via an improved approximation and Monte Carlo method in which the inelastic scattering processes are treated via Ashley's optical model. Our results regarding the electron backscattering coefficient for Si and Ge targets are found to be much higher than those of experiment when using the Vicanek and Urbassek theory. However, the use of Ashley's model via Monte Carlo method gives results that are in reasonably good accord with the experimental data reported in the literature in the low energy regime being considered here.
RESUMEN
The dependence on hydrostatic pressure of the electronic and optical properties of zinc-blende AlSb semiconducting material in the pressure range of 0-20kbar has been reported using a pseudopotential approach. At zero pressure, our findings showed that the electron and heavy hole effective masses are 0.11 and 0.38m0, respectively. Moreover, our results yielded values of 3.3289 and 11.08 for refractive index and high frequency dielectric constant, respectively. These results are found to be in good accord with experiment. Upon compression, all physical parameters of interest showed a monotonic behavior. The pressure-induced energy shifts for the optical transition related to band-gaps indicated that AlSb remains an indirect (Ð-X) band-gap semiconductor at pressures from 0 to 20kbar. The trend in all features of interest versus pressure has been presented and discussed. It is found that the lattice parameter is reduced from 0.61355 to 0.60705nm when pressure is raised from 0 to 20kbar. The present investigation may be useful for mid-infrared lasers applications, detectors and communication devices.
