Multicolor Depth-Resolved Cathodoluminescence from Eu-Doped SiOC Thin Films.

A very bright room-temperature cathodoluminescence (CL) signal, tunable in the visible range by changing the Eu(2+) concentration, has been observed in Eu-doped SiOC films. Depth-resolved CL measurements demonstrate that a bilayer consisting of two SiOC films containing different Eu concentrations allows the continuous tuning of the Eu(2+) emission from blue to green by changing the energy of the exciting electrons. Furthermore, the proper control at the nanoscale of the electron penetration depth allows to obtain a high-quality white light emission. The compatibility of SiOC films with Si technology opens the way to promising applications of Eu-based materials in lighting and display technologies.

SiOC thin films: an efficient light source and an ideal host matrix for Eu2+ ions.

The intense luminescence of SiOC layers is studied and its dependence on the parameters of the thermal annealing process elucidated. Although the emission of SiOC is bright enough to be interesting for practical applications, this material is even more promising as a host matrix for optically active Eu ions. Indeed, when incorporated in a SiOC matrix, Eu(3+) ions are efficiently reduced to Eu(2+), producing a very strong visible luminescence peaked at 440 nm. Eu(2+) ions benefit also of the occurrence of an energy transfer mechanism involving the matrix, which increases the efficiency of photon absorption for exciting wavelengths shorter than 300 nm. We evaluate that Eu doping of SiOC produces an enhancement of the luminescence intensity at 440 nm accounting for about a factor of 15. These properties open the way to new promising perspectives for the application of Eu-doped materials in photonic and lighting technologies.

Eu3+ reduction and efficient light emission in Eu2O3 films deposited on Si substrates.

A stable Eu3+ → Eu2+ reduction is accomplished by thermal annealing in N2 ambient of Eu2O3 films deposited by magnetron sputtering on Si substrates. Transmission electron microscopy and x-ray diffraction measurements demonstrate the occurrence of a complex reactivity at the Eu2O3/Si interface, leading to the formation of Eu2+ silicates, characterized by a very strong (the measured external quantum efficiency is about 10%) and broad room temperature photoluminescence (PL) peak centered at 590 nm. This signal is much more efficient than the Eu3+ emission, mainly consisting of a sharp PL peak at 622 nm, observed in O2-annealed films, where the presence of a SiO2 layer at the Eu2O3/Si interface prevents Eu2+ formation.