Healthcare attendance styles among long-term unemployed people with substance-related and mood disorders.

BACKGROUND: Both increased and decreased health service usage and unmet care needs are more prevalent among unemployed people than in the general population. STUDY DESIGN: This study investigates the associations of substance-related and mood disorders among long-term unemployed people with styles of healthcare attendance in Finland. METHODS: The study material consisted of the health register information on 498 long-term unemployed people in a project screening for work disabilities. The data were analysed by mixed methods: qualitative typological analysis was applied to identify differential healthcare attendance styles, and the associations of the obtained styles with mental health disorders were analysed quantitatively by multinomial logistic regression. RESULTS: Three styles, characterized as smooth, faltering and marginalized, were identified. Compared with participants with the smooth attendance style without mental disorders, those with the faltering style had tenfold relative risk for substance-related disorder and fourfold relative risk for mood disorder. Those with the marginalized style had fivefold relative risk for substance-related disorder and twofold relative risk for mood disorder. Adjusting for background characteristics did not alter the statistical significance of substance-related disorder. In the case of mood disorders, the statistical significance persisted throughout the adjustments in the faltering style. CONCLUSION: Dysfunctional use of health services is more common among people with substance-related or mood disorders, who are at risk of drifting towards long-term unemployment and work disabilities. The early detection of those with faltering or marginalized healthcare attendance style may prevent prolonged unemployment, enable rehabilitation measures and reduce the risk of disability pensions.

Traceable methods for vertical scale characterization of dynamic stroboscopic scanning white-light interferometer measurements.

Stroboscopic scanning white-light interferometry (SSWLI) can be used for 3D imaging of oscillating samples. It allows measurement of micrometer to millimeter size samples with nanometer vertical precision. Unlike coherent light source systems the SSWLI can measure unambiguously samples with vertical steps. Traceability of the vertical displacement measurement is important with SSWLI since the height measurement is not related to any specific monochromatic light wavelength. For static measurements SSWLI can be calibrated using, e.g., step height standards, but to characterize dynamic measurements traceable samples with accurate motion are needed due to error sources related to the frequency response of the SSWLI. In the presented method, SSWLI measurements are performed on dynamic transfer standards, which are characterized using a laser interferometer traceable to the SI meter. In this work dynamic SSWLI measurements at subkilohertz to 10.7 kHz frequencies with micrometer range displacement are characterized. The expanded uncertainty (k=2) was 9.6 nm for a measured displacement of 766 nm at 10.7 kHz. The methodology can be used up to the frequency limits of the SSWLI using suitable samples.

Stroboscopic supercontinuum white-light interferometer for MEMS characterization.

We used a supercontinuum-based scanning white-light interferometer to characterize the oscillation of a MEMS device. The output of a commercially available supercontinuum light source (FiberWare Ilum II USB) was modulated to achieve stroboscopic operation. By synchronizing the modulation frequency of the source to the sample oscillation, dynamic 3-D profile measurements were recorded. These results were validated against those obtained with a white light LED setup. The measured maximum deflection of a 400×25×4 µm(3) microbridge driven with 0-6.8 V sinusoidal voltage at 10 Hz was 1.42±0.03 µm (supercontinuum), which agreed with the LED measurement. The method shows promise for characterization of high-frequency MEMS devices.