Contemporary x-ray wavelength metrology and traceability.

We report recent advances in absolute x-ray wavelength metrology in the context of producing modern standard reference data. Primary x-ray wavelength standards are produced today using diffraction spectrometers using crystal optics arranged to be operated in dispersive and non-dispersive geometries, giving natural-line-width limited profiles with high resolution and accuracy. With current developments, measurement results can be made traceable to the Système internationale definition of the meter by using diffraction crystals that have absolute lattice-spacing provenance through x-ray-optical interferometry. Recent advances in goniometry, innovation of electronic x-ray area detectors, and new in situ alignment and measurement methods now permit robust measurement and quantification of previously-elusive systematic uncertainties. This capability supports infrastructures like the NIST Standard Reference Data programs and the International Initiative on X-ray Fundamental Parameters and their contributions to science and industry. Such data projects are further served by employing complementary wavelength-and energy-dispersive spectroscopic techniques. This combination can provide, among other things, new tabulations of less-intense x-ray lines that need to be identified in x-ray fluorescence investigation of uncharacterized analytes. After delineating the traceability chain for primary x-ray wavelength standards, and NIST efforts to produce standard reference data and materials in particular, this paper posits the new opportunities for x-ray reference data tabulation that modern methods now afford.

Enhancement of lanthanide evaporation by complexation: dysprosium tri-iodide mixed with indium iodide and thulium tri-iodide mixed with thallium iodide.

The vapors in equilibrium with condensates of DyI3, DyI3/InI, TmI3, and TmI3/TlI were observed over the temperature range from 900 K to 1400 K using x-ray induced fluorescence. The total densities of each element (Dy, Tm, In, Tl, and I) in the vapor, summed over all atomic and molecular species, were determined. Dramatic enhancements in the total vapor densities of Dy and Tm were observed in the vapors over DyI3/InI and TmI3/TlI as compared to the vapors over pure DyI3 and pure TmI3, respectively. An enhancement factor exceeding 10 was observed for Dy at T ≈ 1020 K, decreasing to 0 at T ≈ 1250 K. An enhancement factor exceeding 20 was observed for Tm at T ≈ 1040 K, decreasing to 0 at T ≈ 1300 K. Such enhancements are expected from the formation of the vapor-phase hetero-complexes DyInI4 and TmTlI4. Numerical simulations of the thermo-chemical equilibrium suggest the importance of additional complexes in liquid phases. A description of the measurement technique is given. Improvements in the absolute calibration lead to an approximately 40% correction to previously reported preliminary results [J. J. Curry et al., Chem. Phys. Lett. 507, 52 (2011); Appl. Phys. Lett. 100, 083505 (2012)].

Testing three-body quantum electrodynamics with trapped Ti20+ ions: evidence for a Z-dependent divergence between experiment and calculation.

We report a new test of quantum electrodynamics (QED) for the w (1s2p(1)P(1)→1s(2)(1)S(0)) x-ray resonance line transition energy in heliumlike titanium. This measurement is one of few sensitive to two-electron QED contributions. Systematic errors such as Doppler shifts are minimized in our experiment by trapping and stripping Ti atoms in an electron beam ion trap and by applying absolute wavelength standards to calibrate the dispersion function of a curved-crystal spectrometer. We also report a more general systematic discrepancy between QED theory and experiment for the w transition energy in heliumlike ions for Z>20. When all of the data available in the literature for Z=16-92 are taken into account, the divergence is seen to grow as approximately Z(3) with a statistical significance on the coefficient that rises to the level of 5 standard deviations. Our result for titanium alone, 4749.85(7) eV for the w line, deviates from the most recent ab initio prediction by 3 times our experimental uncertainty and by more than 10 times the currently estimated uncertainty in the theoretical prediction.

Hard x-ray transmission crystal spectrometer at the OMEGA-EP laser facility.

The transmission crystal spectrometer (TCS) is approved for taking data at the OMEGA-EP laser facility since 2009 and will be available for the OMEGA target chamber in 2010. TCS utilizes a Cauchois type cylindrically bent transmission crystal geometry with a source to crystal distance of 600 mm. Spectral images are recorded by image plates in four positions, one IP on the Rowland circle and three others at 200, 400, and 600 mm beyond the Rowland circle. An earlier version of TCS was used at LULI on experiments that determined the x-ray source size from spectral line broadening on one IP positioned behind the Rowland circle. TCS has recorded numerous backlighter spectra at EP for point projection radiography and for source size measurements. Hard x-ray source size can be determined from the source broadening of both K shell emission lines and from K absorption edges in the bremsstrahlung continuum, the latter being a new way to measure the spatial extent of the hard x-ray bremsstrahlung continuum.

Asymmetrically cut crystal pair as x-ray magnifier for imaging at high intensity laser facilities.

The potential of an x-ray magnifier prepared from a pair of asymmetrically cut crystals is studied to explore high energy x-ray imaging capabilities at high intensity laser facilities. OMEGA-EP and NIF when irradiating mid and high Z targets can be a source of high-energy x-rays whose production mechanisms and use as backlighters are a subject of active research. This paper studies the properties and potential of existing asymmetric cut crystal pairs from the National Institute of Standards and Technology (NIST) built in a new enclosure for imaging x-ray sources. The technique of the x-ray magnifier has been described previously. This new approach is aimed to find a design that could be used at laser facilities by magnifying the x-ray source into a screen far away from the target chamber center, with fixed magnification defined by the crystals' lattice spacing and the asymmetry angles. The magnified image is monochromatic and the imaging wavelength is set by crystal asymmetry and incidence angles. First laboratory results are presented and discussed.

Scaling studies with the dual crystal spectrometer at the OMEGA-EP laser facility.

The dual crystal spectrometer (DCS) is an approved diagnostic at the OMEGA and the OMEGA-EP laser facilities for the measurement of high energy x-rays in the 11-90 keV energy range, e.g., for verification of the x-ray spectrum of backlighter targets of point projection radiography experiments. DCS has two cylindrically bent transmission crystal channels with image plate detectors at distances behind the crystals close to the size of the respective Rowland circle diameters taking advantage of the focusing effect of the cylindrically bent geometry. DCS, with a source to crystal distance of 1.2 m, provides the required energy dispersion for simultaneous detection of x-rays in a low energy channel (11-45 keV) and a high-energy channel (19-90 keV). A scaling study is described for varied pulse length with unchanged laser conditions (energy, focusing). The study shows that the Kα line intensity is not strongly dependent on the length of the laser pulse.

A curved crystal spectrometer for energy calibration and spectral characterization of mammographic x-ray sources.

Clinical efficacy of diagnostic radiology for mammographic examinations is critically dependent on source characteristics, detection efficiency, image resolution and applied high voltage. In this report we focus on means for evaluation of source-dependent issues including noninvasive determination of the applied high voltage, and characterization of intrinsic spectral distributions which in turn reflect the effects of added filtration and target and window contamination. It is shown that a particular form of x-ray curved crystal spectrometry with electronic imaging can serve to determine all relevant parameters within the confines of a standard clinical exposure.

Flat and curved crystal spectrography for mammographic X-ray sources.

The demand for improved spectral understanding of mammographic X-ray sources and non-invasive voltage calibration of such sources has led to research into applications using curved crystal spectroscopy. Recent developments and the promise of improved precision and control are described. Analytical equations are presented to indicate effects of errors and alignment problems in the flat and curved crystal systems. These are appropriate for all detection systems. Application to and testing of spectrographic detection (using standard X-ray film) is presented. Suitable arrangements exist which can be used to measure X-ray tube voltages well below 1 kV precision in the operating range of 20-35 kV.

Noninvasive high-voltage measurement in mammography by crystal diffraction spectrometry.

Wavelength dispersive crystal diffraction spectrometry has been applied to the measurement of the accelerating voltage on an x-ray source in a prototype experiment in the mammographic source. The results indicate that this noninvasive approach can yield determinations of such voltages within 0.1 kV, a level of imprecision that appears adequate for high-level standardization of such potentials.

Precision Comparison of the Lattice Parameters of Silicon Monocrystals.

The lattice spacing comparator established at the National Institute of Standards and Technology to measure the lattice spacing differences between nearly perfect crystals is described in detail. Lattice spacing differences are inferred from the measured differences in Bragg angles for different crystals. The comparator is a two crystal spectrometer used in the nearly nondispersive geometry. It has two x-ray sources, two detectors, and a device which permits remote interchange of the second crystal sample. A sensitive heterodyne interferometer which is calibrated with an optical polygon is used to measure the Bragg angles. The crystals are manufactured with nearly equal thicknesses so that the recorded profiles exhibit pendellosung oscillations which permit more precise division of the x-ray profiles. The difference in lattice spacing between silicon samples used at Physikalisch-Technische Bundesanstalt (PTB) and NIST has been measured with a relative uncertainly of 1 × 10-8, This measurement is consistent with absolute lattice spacing measurements made at PTB and NIST. Components of uncertainty associated with systematic effects due to misalignments are derived and estimated.

Erratum: Precision Comparison of the Lattice Parameters of Silicon Monocrystals.

[This corrects the article on p. 1 in vol. 99.].