In dark analysis of PVA/AA materials at very low spatial frequencies: phase modulation evolution and diffusion estimation.

Molecular diffusion effects have been widely studied inside photopolymers for holographic applications. Recently some works have focused on low spatial frequencies to evaluate in real time the monomer diffusion effects. Assuming a Fermi-Dirac function-based profile, we have fitted the diffracted intensities, reflected and transmitted (up to the 8th order), to obtain the phase and surface profile of the recorded gratings. We have studied the influence of diffusion in polyvinyl-alcohol/acrylamide for the range of spatial frequencies between 2 lines/mm and 6 lines/mm. We have demonstrated the influence of the spatial frequency on the magnitude and sign of the material volume variations. We also studied in dark the evolution of the grating shape. We show that it is possible to achieve diffractive gratings with diffraction efficiency in the first order near 35% if the in dark evolution is taken into account. Furthermore we present a method to calculate the monomer diffusivity in photopolymers. The differential equation is deduced and solved, and experimental average value is obtained (D=1.1 x 10(-8) cm(2)s(-1)).

Spatial-phase-modulation-based study of polyvinyl-alcohol/acrylamide photopolymers in the low spatial frequency range.

Photopolymers are appealing materials for the fabrication of diffractive optical elements (DOEs). We evaluate the possibilities of polyvinyl-alcohol/acrylamide-based photopolymers to store diffractive elements with low spatial frequencies. We record gratings with different spatial frequencies in the material and analyze the material behavior measuring the transmitted and the reflected orders as a function of exposition. We study two different compositions for the photopolymer, with and without a cross-linker. The values of diffraction efficiency achieved for both compositions make the material suitable to record DOEs with long spatial periods. Assuming a Fermi-Dirac-function-based profile, we fitted the diffracted intensities (up to the eighth order) to obtain the phase profile of the recorded gratings. This analysis shows that it is possible to achieve a phase shift larger than 2pi rad with steep edges in the periodic phase profile. In the case of the measurements in reflection, we have obtained information dealing with the surface profile, which show that it has a smooth shape with an extremely large phase-modulation depth.