Asymmetric grazing incidence small angle x-ray scattering and anisotropic domain wall motion in obliquely grown nanocrystalline Co films.

Strong asymmetries have been observed in grazing incidence small angle x-ray scattering (GISAXS) in situ patterns obtained from 30 nm-thick nanocrystalline Co films prepared by oblique sputtering (15°-75° off-sample normal). These asymmetries have been qualitatively simulated by a simple model consisting of an ensemble of 8 nm-wide inclined Co nanocolumns. It is found that narrow inclined features appear in the diffuse background resembling those characteristic of faceted systems, which can be used to obtain straightforward non-destructive estimations of buried nanocolumnar grains inclination, even for oblique angles below 45°, when the stronger and broader asymmetric features of the pattern are not yet fully formed. Furthermore, using magneto-optical microscopy, a marked change in the magnetic domain's nucleation and growth process has been observed in the sample prepared at 75°, with the stronger GISAXS asymmetries. Easy axis magnetization reversal starts by a random and homogeneous nucleation of small (∼µm) elongated domains aligned with the nanocolumn's long axis and proceeds through the preferred propagation of head-to-head domain walls (DWs) along the applied field direction. This peculiar magnetic behavior indicates that the strongly anisotropic nanostructuring created by the oblique growth process is equivalent, from a magnetic point of view, to an array of self-assembled buried nanowires. These results show how GISAXS and magneto-optical microscopy can be combined as a powerful tool for correlating the morphology and magnetism of thin nanostructured systems.

Evolution of surface morphology at the early stage of Al2O3 film growth on a rough substrate.

We present an experimental study of the evolution of the surface of a growing film as a function of the statistical parameters of the virgin substrate roughness. The growth of sputter-deposited Al(2)O(3) films onto Si substrates was followed in situ using an x-ray scattering technique. Despite the use of substrates presenting different roughness correlation length and crystallographic orientation, the evolution of the film roughness is demonstrated to obey the same scaling law, i.e., with the same static and dynamic exponents. Approaches to accurately determine the scaling exponents from x-ray scattering data are discussed.

Diffractive-refractive optics: low-aberration Bragg-case focusing by precise parabolic surfaces.

Based on analytical formulae calculations and ray-tracing simulations a low-aberration focal spot with a high demagnification ratio was predicted for a diffractive-refractive crystal optics device with parabolic surfaces. Two Si(111) crystals with two precise parabolic-shaped grooves have been prepared and arranged in a dispersive position (+,-,-,+) with high asymmetry. Experimental testing of the device at beamline BM05 at the ESRF provided a focal spot size of 38.25 microm at a focal distance of 1.4 m for 7.31 keV. This is the first experiment with a parabolic-shaped groove; all previous experiments were performed with circular grooves which introduced extreme aberration broadening of the focal spot. The calculated and simulated focal size was 10.8 microm at a distance of 1.1 m at 7.31 keV. It is assumed that the difference between the measured and calculated/simulated focal spot size and focal distance is due to insufficient surface quality and to alignment imperfection.

Enhancement of antiferromagnetic coupling in magnetic multilayers by low energy ion beam substrate nanopatterning.

Ion beam irradiation has been shown to be an interesting tool for tailoring the magnetic properties of thin films and multilayers. The modified properties include magnetic anisotropy, interlayer exchange coupling, exchange bias, magnetic domain structure and magnetization reversal. In this work, new results are shown concerning the enhancement, by one order of magnitude, of the antiferromagnetic coupling strength in amorphous CoSi/Si multilayers by irradiating Si(100) substrates with 1 keV Ar(+) ions. The ion beam exposure induces an increase of the substrate roughness, from 0.07 to 0.88 nm, which enhances antiferromagnetic coupling in the magnetic multilayers grown on top. One possible mechanism governing this enhancement is discussed, related to the formation of magnetic/non-magnetic regions where dipolar interactions could stabilize the antiferromagnetic alignment. The presence of non-magnetic regions is suggested by the observed trend to superparamagnetism, and is expected since the Curie temperature of the amorphous CoSi alloy used is slightly above but very close to room temperature. Accordingly, small fluctuations in the local composition, leading to an enrichment of Si, would produce non-magnetic regions enabling dipolar interactions to take place. Furthermore, the ion beam induced increase of roughness makes surface diffusion of the atoms arriving at the sample difficult, favoring the formation of local non-magnetic inhomogeneities. Finally, the role of other possible mechanisms to enhance antiferromagnetic coupling is also briefly discussed.

Diffractive-refractive optics in the Laue case: first experiment.

The possibility of sagittally focusing synchrotron radiation using an asymmetric Laue crystal with profiled surfaces has been experimentally demonstrated for the first time. The sample was a Si single crystal with two parallel cylindrical holes of diameter 8 mm. The axes of the holes formed an angle of 7.95 degrees with the (111) diffracting planes and were arranged vertically with respect to the diffracting planes. 15.35 keV synchrotron radiation was diffracted in the space between the holes. The minimum thickness of this Laue crystal was 0.5 mm. The diffracted beam formed an angle of 0.55 degrees with the exit surface. The experiment was performed at beamline BM05 at the ESRF. The length of the beamline was not sufficiently long to detect the focus, but the experiment clearly showed that the diffracted beam was sagittally convergent.