Dataset for the comparison of vacuum-treated and as-etched porous silicon samples in terms of the evolution of oxidation at low temperatures.

The development of chemical sensors made from porous silicon is a task that has been addressed for several years. In order to have a reliable sensing material, stability must be guaranteed. Oxidation in silicon degrades the sensing capability. The data presented in this article provides some important insights concerning the treatment of samples that can improve the material stability against oxidation. For this purpose, Fourier Transformed Infrared (FTIR) measurements using an Attenuated Total Reflectance (ATR) additament were employed to extract information concerning oxidation on the samples submitted to different temperatures. Photoluminescent (PL) measurements were also performed on the samples in order to extract information on nanocrystals sizes and their relationship with oxidation.

Transmission of visible light through oxidized copper films: feasibility of using a spectral projected gradient method.

Transmittance measurements at normal incidence were carried out over the visible spectral range for metallic thin films deposited by electron beam evaporation on thick glass substrates. The presence of an inhomogeneous thin layer of Cu2O covering the deposited Cu films is required for a satisfactory model of the measurements taken from various samples with increasing thickness. A spectral projected gradient method is used to invert the transmission spectra from which the wavelength dependence of the effective dielectric function of the oxidized coating layer is obtained. Then an effective medium model is used to estimate the volume fraction of internal voids randomly distributed through the surface layer.