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We developed a technique that enables replacement of a metallic waveguide cladding with a low-index (n≈1.4) material - CaF2 or BaF2. It is transparent from the mid-IR up to the visible range: elevated confinement is preserved while introducing an optical entryway through the substrate. Replacing the metallic backplane also allows double-side patterning of the active region. Using this approach, we demonstrate strong light-matter coupling between an intersubband transition (λâ¼10 µm) and a dispersive resonator at 300 K and at 78 K. Finally, we evaluate this approach's potential as a platform for waveguiding in the mid-IR spectral range, with numerical simulations that reveal losses in the 1-10 cm-1 range.
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We have developed a reflection tomographic microscope in which the sample is reconstructed from different holograms recorded under various angles and wavelengths of incidence. We present an iterative inversion algorithm based on a rigorous modeling of the wave-sample interaction that processes all the data simultaneously to estimate the sample permittivity distribution. We show that using several wavelengths permits a significant improvement of the reconstruction, especially along the optical axis.
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Total internal reflection microscopy is mainly used in its fluorescence mode and is the reference technique to image fluorescent proteins in the vicinity of cell membranes. Here, we show that this technique can easily become a phase microscope by simply detecting the coherent signal resulting from the interference between the field scattered by the probed sample and the total internal reflection. Moreover, combining several illumination angles permits generating synthetic aperture reconstructions with improved resolutions compared to standard label-free microscopy techniques.
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Microscopía Fluorescente/métodos , Fenómenos Ópticos , Reconocimiento de Normas Patrones Automatizadas , Diseño de EquipoRESUMEN
Tomographic diffractive microscopy is a three-dimensional imaging technique that reconstructs the permittivity map of the probed sample from its scattered field, measured both in phase and in amplitude. Here, we detail how polarization-resolved measurements permit us to significantly improve the accuracy and the resolution of the reconstructions, compared to the conventional scalar treatments used so far. An isotropic transverse resolution of about 100 nm at a wavelength of 475 nm is demonstrated using this approach.
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Oxide-free bonding of a III-V active stack emitting at 1300-1600 nm to a silicon-on-insulator wafer offers the capability to electrically inject lasers from the silicon side. However, a typical 500-nm-thick silicon layer notably attracts the fundamental guided mode of the silicon + III-V stack, a detrimental feature compared to established III-V Separate-Confinement Heterostructure (SCH) stacks. We experimentally probe with photoluminescence as an internal light source the guiding behavior for oxide-free bonding to a nanopatterned silicon wafer that acts as a low-index barrier. We use a sub-wavelength square array of small holes as an effective "low-index silicon" medium. It is weakly modulated along one dimension (superperiodic array) to outcouple the resulting guided modes to free space, where we use an angle-resolved spectroscopy study. Analysis of experimental branches confirms the capability to operate with a fundamental mode well localized in the III-V heterostructures.
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Rayos Láser , Óxidos/química , Silicio/química , Diseño de EquipoRESUMEN
Tomographic diffractive microscopy (TDM) is a label-free imaging technique that reconstructs the 3D refractive index map of the probed object with an improved resolution compared to confocal microscopy. In this work, we consider a TDM implementation in which the sample is deposited on a reflective substrate. We show that this configuration requires calibration and inversion procedures that account for the presence of the substrate for getting highly resolved quantitative reconstructions.
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Procesamiento de Imagen Asistido por Computador/métodos , Imagenología Tridimensional/métodos , Microscopía Confocal/métodos , Microscopía/métodos , Tomografía/métodos , Algoritmos , Análisis de Fourier , RefractometríaRESUMEN
The interferogram of a high index phase mask of 200 nm period under normal incidence of a collimated beam at 244 nm wavelength with substantially suppressed zeroth order produces a 100 nm period grating in a resist film under immersion. The paper describes the phase mask design, its fabrication, the effect of electron-beam lithographic stitching errors and optical assessment of the fabricated sub-cutoff grating.
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Nanotecnología/instrumentación , Fotograbar/instrumentación , Refractometría/instrumentación , Diseño de Equipo , Análisis de Falla de EquipoRESUMEN
We have developed surface-emitting single-mode quantum cascade lasers which employ high-contrast photonic-crystal resonators. The devices operate on band-edge states of the photonic band-structure. The mode profile and polarization characteristics of the band-edge modes are calculated by three-dimensional finite-difference time-domain simulation. Experimentally, the spectral properties, the far-field patterns, and the polarization characteristics of the lasers are determined and compared with simulations. The good agreement between the simulations and the experiments confirms that the hexapolar mode at the Gamma-point band-edge gives rise to lasing. By using a novel and advanced fabrication method, deep and vertical PhC holes are fabricated with no metal redeposition on the sidewalls, which improves the laser performance with respect to the current status. The angular of the output beam is approximately 15 masculine, and the side mode suppression ratio of the single mode emission is about 25 dB. The threshold current density at 78 K and the maximum operation temperature are 7.6 kA/cm2 and 220 K, respectively. The performance is mainly limited by the loss induced by surface plasmon waveguide, which can be overcome by using an optimized dielectric waveguide structure.
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Rayos Láser , Resonancia por Plasmón de Superficie/instrumentación , Transductores , Diseño de Equipo , Análisis de Falla de Equipo , Fotones , Teoría Cuántica , VibraciónRESUMEN
We investigated the impact of electron-beam lithography writing imperfections on the performance of two-dimensional resonant grating notch filters. This large area photonic device provides an interesting benchmark to assess the acceptable limits of unavoidable fabrication errors. We found that field stitching errors up to 100 nm have no detrimental effect on the filter linewidth, whereas a 2.5 nm electron-beam writing resolution, responsible for digitization disorder, is tolerable only for high-index contrast filter designs. Such an electron-beam writing strategy could also be beneficial for photonic crystal guiding structures or any periodic nanopatterned device with which the optical mode interacts with a large number of periodic elementary units.
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Optical diffraction tomography (ODT) is a recent imaging technique that combines the experimental methods of phase microscopy and synthetic aperture with the mathematical tools of inverse scattering theory. We show experimentally that this approach permits us to obtain the map of permittivity of highly scattering samples with axial and transverse resolutions that are much better than that of a microscope with the same numerical aperture.
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The peaks in the reflectivity spectrum of waveguide gratings observed when the incident beam couples to a mode of the structure are promising features for many applications. However their weak angular tolerance and their strong polarization sensitivity, especially under oblique incidence, limit their interest in practice. These problems can be overcome by forming slow degenerate modes outside the usual high symmetry points of the Brillouin zone with a complex periodic pattern [Fehrembach, Appl. Phys. Lett. 86, 121105 (2005)]. We show experimentally that spectrally sharp, lambda/Deltalambda approximately 4000, polarization-independent, angularly tolerant optical resonances can be obtained by exciting these modes under oblique incidence.
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Resonant grating filters are promising components for free-space narrowband filtering. Unfortunately, due to their weak angular tolerance, their performances are strongly deteriorated when they are illuminated with a standard collimated beam. Yet this problem can be overcome by resorting to a complex periodic pattern known as the doubly periodic grating [Lemarchand et al., Opt. Lett.23, 1149 (1998)]. We report what we believe to be the first experimental fabrication and characterization of a bidimensional doubly periodic grating filter. We obtained a 0.5 nm bandpass polarization independent reflection filter for telecom wavelengths (1520-1570 nm) that presents a transmittivity minimum of 18% with a standard incident collimated beam.
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We report on reflection modulation results near 1.55 mum in InP-based two-dimensional photonic crystals. The fabrication technology uses a polymeric bonding technique to integrate the InP thin-slab onto a Silicon wafer. Reflectivity modulation greater than 90% is obtained by pumping at 810 nm with optical excitation densities of 15 muJ/cm(2). The resulting optical broadband modulation is based on the saturation of absorption of InGaAs quantum wells at a photonic mode frequency tunable by lithography.
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The group index dispersion and birefringence of guided modes supported by straight photonic crystal (PhC) waveguides are theoretically and experimentally investigated as a function of the waveguide width within various reduced frequency domains. Within the photonic gap and far from the Brillouin zone edges, strongly confined modes supported by narrow PhC guides exhibit both a group index and a birefringence larger than those of a deep ridge. These two results evidence the contribution of the photonic gap to the guiding mechanism in the refractivelike domain.
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High resolution images of planar photonic crystal (PC) optical components fabricated by e-beam lithography in various materials are analyzed to characterize statistical properties of common 2D geometrical imperfections. Our motivation is to attempt an intuitive, while rigorous statistical description of fabrication imperfections to provide a realistic input into theoretical modelling of PC device performance.