A New Optical Remote Sensing Technique for High-Resolution Mapping of Soil Moisture.

The recently developed OPtical TRApezoid Model (OPTRAM) has been successfully applied for watershed scale soil moisture (SM) estimation based on remotely sensed shortwave infrared (SWIR) transformed reflectance (TRSWIR) and the normalized difference vegetation index (NDVI). This study is aimed at the evaluation of OPTRAM for field scale precision agriculture applications using ultrahigh spatial resolution optical observations obtained with one of the world's largest field robotic phenotyping scanners located in Maricopa, Arizona. We replaced NDVI with the soil adjusted vegetation index (SAVI), which has been shown to be more accurate for cropped agricultural fields that transition from bare soil to dense vegetation cover. The OPTRAM was parameterized based on the trapezoidal geometry of the pixel distribution within the TRSWIR-SAVI space, from which wet- and dry-edge parameters were determined. The accuracy of the resultant SM estimates is evaluated based on a comparison with ground reference measurements obtained with Time Domain Reflectometry (TDR) sensors deployed to monitor surface, near-surface and root zone SM. The obtained results indicate an SM estimation error between 0.045 and 0.057 cm3 cm-3 for the near-surface and root zone, respectively. The high resolution SM maps clearly capture the spatial SM variability at the sensor locations. These findings and the presented framework can be applied in conjunction with Unmanned Aerial System (UAS) observations to assist with farm scale precision irrigation management to improve water use efficiency of cropping systems and conserve water in water-limited regions of the world.

QTL analysis of resistance to Fusarium head blight in the novel wheat germplasm CJ 9306. I. Resistance to fungal spread.

Fusarium head blight (FHB or scab) caused by Fusarium species is a destructive disease in wheat and barley worldwide. The objectives of our study were to identify quantitative trait loci (QTLs) for resistance to FHB spread (Type II resistance) and to quantify the magnitude of their effects in a novel highly resistant wheat germplasm, CJ 9306. A set of 152 F(7) recombinant inbred lines (RILs) derived from a cross Veery/CJ 9306 and two parents were evaluated for FHB resistance by single-floret inoculation in three greenhouse experiments in 2002 and 2004. Percentage (PSS) and number (NSS) of scabby spikelets at 25 days post-inoculation were analyzed. In total 682 simple sequence repeat (SSR) markers were screened for polymorphism between the two parents, and a genetic linkage map was constructed with 208 polymorphic markers. Ten QTLs associated with FHB resistance were detected, five from CJ 9306 and five from Veery. The major QTL on 3BS (QFhs.ndsu-3BS) was validated in CJ 9306, exhibiting greatest additive effects and explained 30.7% of phenotypic variation for PSS on the overall average of three experiments. Another major QTL on 2DL (QFhs.nau-2DL) from CJ 9306 explained 9.9-28.4% of phenotypic variation, with a significant QTL x environment interaction. QFhs.nau-1AS and QFhs.nau-7BS showed lower additive effects and explained lower variance (4.5-9.5%). A QTL on 5AS, decreasing PSS by 10.3% on average, was validated by simple marker analysis and joint trait/experiment IM/CIM analysis despite insignificance for single-experiment IM and CIM analyses. Likewise, QFhs.nau-2BL and QFhs.nau-1BC from Veery could reduce PSS by 13.2 and 11.4%, respectively. The effects of other three minor QTLs from Veery were significant for one experiment and combined analysis. Comparisons of two- and three-locus combinations suggested that the effects of FHB resistance QTLs/genes could be accumulated, and the resistance could be feasibly enhanced by selection of favorable alleles for multiple loci. Four two-locus combinations and two three-locus combinations were suggested as the preferential choices in practical marker-assisted selection program.

QTL analysis of resistance to Fusarium head blight in the novel wheat germplasm CJ 9306. II. Resistance to deoxynivalenol accumulation and grain yield loss.

Fusarium head blight (FHB or scab) caused by Fusarium species is a destructive disease in wheat, not only causing dramatic decrease of grain yield and quality, but also leading to serious mycotoxin contamination in the infected grains. This study was conducted to identify and quantify quantitative trait loci (QTLs) contributing to resistance to deoxynivalenol (DON) accumulation as well as to grain yield loss in a population of 152 F(7) recombinant inbred lines (RILs) derived from the cross Veery/CJ 9306. DON content in scabby grains and relative decreases of yield components were analyzed. Two new QTLs (QFhs.nau-2DL and QFhs.nau-1AS) for resistance to DON accumulation caused by FHB in wheat were detected, and QTLs QFhs.ndsu-3BS and QFhs.nau-5AS were also validated in CJ 9306, based on a constructed genetic linkage map. On the average of three experiments, major QTLs QFhs.ndsu-3BS and QFhs.nau-2DL explained up to 23 and 20% of phenotypic variation, respectively. QFhs.nau-1AS and QFhs.nau-5AS separately explained 4-6% of phenotypic variation. The differences among years/experiments were significant for all the four QTLs. However, the QTL x environment interaction was significant only for QFhs.nau-2DL, but not for the others. The results suggest that simple sequence repeat (SSR) markers Xgwm533b associated with QFhs.ndsu-3BS, and Xgwm539 associated with QFhs.nau-2DL could be used in marker-assisted selection to enhance resistance to DON accumulation. QFhs.ndsu-3BS + QFhs.nau-2DL and QFhs.nau-2DL + QFhs.nau-5AS would be the optimum choices for two-locus combinations. QFhs.ndsu-3BS was also validated in CJ 9306 for resistance to grain yield loss, explaining 8-15% of phenotypic variation. No QTLs for resistance to DON accumulation or grain yield loss independent of Type II resistance were found. By comparison, however, either of QFhs.nau-2DL or QFhs.nau-5AS alone and their combination were more contributive to resistance to DON accumulation than to Type II resistance.