RESUMO
The ability to manipulate nano-particles at the nano-scale is critical for the development of active quantum systems. This paper presents a technique to manipulate diamond nano-crystals at the nano-scale using a scanning electron microscope, nano-manipulator and custom tapered optical fibre probes. The manipulation of a approximately 300 nm diamond crystal, containing a single nitrogen-vacancy centre, onto the endface of an optical fibre is demonstrated. The emission properties of the single photon source post manipulation are in excellent agreement with those observed on the original substrate.
Assuntos
Nanotecnologia/métodos , Cristalização , Diamante/química , Desenho de Equipamento , Íons , Microscopia Confocal/métodos , Microscopia Eletrônica de Varredura/métodos , Nanotecnologia/instrumentação , Nitrogênio/química , Óptica e Fotônica , Fótons , Teoria Quântica , Silício/química , Temperatura , Fatores de TempoRESUMO
We present a new technique for determining the refractive index profiles of axially symmetric optical fibers based on imaging phase gradients introduced into a transmitted optical field by a fiber sample. An image of the phase gradients within the field is obtained using a new non-interferometric technique based on bright field microscopy. This provides sufficient information to reconstruct the refractive index profile using the inverse Abel transform. The technique is robust, rapid and possesses high spatial resolution and we demonstrate its application to the reconstruction of the refractive index profiles of a single-mode and a multimode optical fiber.
RESUMO
The application of quantitative phase microscopy to refractive-index profiling of optical fibers is demonstrated. Phase images of axially symmetric optical fibers immersed in index-matching fluid are obtained, and the inverse Abel transform is used to obtain the radial refractive-index profile. This technique is straightforward, nondestructive, repeatable, and accurate. Excellent agreement, to within approximately 0.0005, between this method and the index profile obtained with a commercial profiler is obtained.