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1.
Materials (Basel) ; 15(6)2022 Mar 15.
Artigo em Inglês | MEDLINE | ID: mdl-35329598

RESUMO

X-ray Diffraction has been fully exploited as a probe to investigate crystalline materials. However, very little research has been carried out to unveil its potentialities towards amorphous materials. In this work, we demonstrated the capabilities of Grazing Incidence X-ray Diffraction (GIXRD) as a simple and fast tool to obtain quantitative information about the composition of amorphous mixed oxides. In particular, we evidenced that low angle scattering features, associated with local structure parameters, show a significant trend as a function of the oxide composition. This evolution can be quantified by interpolating GIXRD data with a linear combination of basic analytical functions, making it possible to build up GIXRD peak-sample composition calibration curves. As a case study, the present method was demonstrated on Ta2O5-SiO2 amorphous films deposited by RF-magnetron sputtering. GIXRD results were validated by independent measurement of the oxide composition using Rutherford Backscattering Spectrometry (RBS). These materials are attracting interest in different industrial sectors and, in particular, in photovoltaics as anti-reflection coatings. Eventually, the optical properties measured by spectroscopic ellipsometry were correlated to the chemical composition of the film. The obtained results highlighted not only a correlation between diffraction features and the composition of amorphous films but also revealed a simple and fast strategy to characterize amorphous thin oxides of industrial interest.

2.
Materials (Basel) ; 14(5)2021 Feb 25.
Artigo em Inglês | MEDLINE | ID: mdl-33668771

RESUMO

We have deposited Ge, SiGe, SiGeSn, AlAs, GaAs, InGaP and InGaAs based structures in the same metalorganic vapor phase epitaxy (MOVPE) growth chamber, in order to study the effect of the cross influence between groups IV and III-V elements on the growth rate, background doping and morphology. It is shown that by adopting an innovative design of the MOVPE growth chamber and proper growth condition, the IV elements growth rate penalization due to As "carry over" can be eliminated and the background doping level in both IV and III-V semiconductors can be drastically reduced. In the temperature range 748-888 K, Ge and SiGe morphologies do not degrade when the semiconductors are grown in a III-V-contaminated MOVPE growth chamber. Critical morphology aspects have been identified for SiGeSn and III-Vs, when the MOVPE deposition takes place, respectively, in a As or Sn-contaminated MOVPE growth chamber. III-Vs morphologies are influenced by substrate type and orientation. The results are promising in view of the monolithic integration of group-IV with III-V compounds in multi-junction solar cells.

3.
Phys Chem Chem Phys ; 14(16): 5705-10, 2012 Apr 28.
Artigo em Inglês | MEDLINE | ID: mdl-22426007

RESUMO

Unprecedented room temperature excitonic emissions are achieved from TiO(2) nanocrystals synthesized at 300 K by supersonic cluster beams. Transmission electron microscopy studies show the crystalline nature of the nanoparticles (NPs) with a diameter ranging from 5 to 30 nm. All the samples show mixed rutile and anatase phases as confirmed by Raman spectroscopy. XPS core level analyses evidence an O/Ti ratio of the as-grown nanoparticles of 2.30 ± 0.04. Two room temperature cathodoluminescence excitonic peaks observed at 3.16 and 3.25 eV are ascribed to the coexistence of rutile and anatase crystallographic phases respectively. Subsequent thermal treatments at 450 °C cause the complete quenching of the UV excitonic emissions and result in a more conventional broad visible band centered at 2.5 eV. HRTEM and XPS studies reveal that, after annealing, the NPs remain single crystals in nature with an O/Ti ratio of 2.20 ± 0.04. These results suggest a correlation between the emission properties and the oxygen concentration of our NPs. The achieved ability to tune the optical properties of TiO(2) nanoparticles is very promising for sensing and energy applications.


Assuntos
Nanopartículas/química , Temperatura , Titânio/química , Tamanho da Partícula , Propriedades de Superfície
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