Variation of bending rigidity with material density: bilayer silica with nanoscale holes.

Two dimensional (2D) materials are a young class of materials that is foreseen to play an important role as building blocks in a range of applications, e.g. flexible electronics. For such applications, mechanical properties such as the bending rigidity κ are important. Only a few published measurements of the bending rigidity are available for 2D materials. Nearly unexplored is the question of how the 2D material density influences the bending rigidity. Here, we present helium atom scattering measurements on a "holey" bilayer silica with a density of 1.4 mg m-2, corresponding to 1.7 monolayers coverage. We find a bending rigidity of 6.6 ± 0.3 meV, which is lower than previously published measurements for a complete 2D film, where a value of 8.8 ± 0.5 meV was obtained. The decrease of bending rigidity with lower density is in agreement with theoretical predictions.

Assessing the amorphousness and periodicity of common domain boundaries in silica bilayers on Ru(0 0 0 1).

Domain boundaries are hypothesized to play a role in the crystalline to amorphous transition. Here we examine domain boundary structures in comparison to crystalline and amorphous structures in bilayer silica grown on Ru(0 0 0 1). Atomically resolved scanning probe microscopy data of boundaries in crystalline bilayer films are analyzed to determine structural motifs. A rich variety of boundary structures including rotational, closed-loop, antiphase, and complex boundaries are identified. Repeating units with ring sizes of 558 and 57 form the two most common domain boundary types. Quantitative metrics are utilized to assess the structural composition and degree of order for the chemically equivalent crystalline, domain boundary, and amorphous structures. It is found that domain boundaries in the crystalline phase show similarities to the amorphous phase in their ring statistics and, in some cases, in terms of the observed ring neighborhoods. However, by assessing order and periodicity, domain boundaries are shown to be distinct from the glassy state. The role of the Ru(0 0 0 1) substrate in influencing grain boundary structure is also discussed.

A Large-Area Transferable Wide Band Gap 2D Silicon Dioxide Layer.

An atomically smooth silica bilayer is transferred from the growth substrate to a new support via mechanical exfoliation at millimeter scale. The atomic structure and morphology are maintained perfectly throughout the process. A simple heating treatment results in complete removal of the transfer medium. Low-energy electron diffraction, Auger electron spectroscopy, scanning tunneling microscopy, and environmental scanning electron microscopy show the success of the transfer steps. Excellent chemical and thermal stability result from the absence of dangling bonds in the film structure. By adding this wide band gap oxide to the toolbox of 2D materials, possibilities for van der Waals heterostructures will be broadened significantly.

Ultrathin silica films: the atomic structure of two-dimensional crystals and glasses.

For the last 15 years, we have been studying the preparation and characterization of ordered silica films on metal supports. We review the efforts so far, and then discuss the specific case of a silica bilayer, which exists in a crystalline and a vitreous variety, and puts us into a position to investigate, for the first time, the real space structure (AFM/STM) of a two-dimensional glass and its properties. We show that pair correlation functions determined from the images of this two-dimensional glass are similar to those determined by X-ray and neutron scattering from three-dimensional glasses, if the appropriate sensitivity factors are taken into account. We are in a position, to verify, for the first time, a model of the vitreous silica structure proposed by William Zachariasen in 1932. Beyond this, the possibility to prepare the crystalline and the glassy structure on the same support allows us to study the crystal-glass phase transition in real space. We, finally, discuss possibilities to use silica films to start investigating related systems such as zeolites and clay films. We also mention hydroxylation of the silica films in order to adsorb metal atoms modeling heterogenized homogeneous catalysts.

The atomic structure of a metal-supported vitreous thin silica film.

Clear as glass: The atomic structure of a metal-supported vitreous thin silica film was resolved using low-temperature scanning tunneling microscopy (STM). Based on the STM image, a model was constructed and the atomic arrangement of the thin silica glass determined (see picture). The total pair correlation function of the structural model shows good agreement with diffraction experiments performed on vitreous silica.