Biorealistic Neuronal Temperature-Sensitive Dynamics within Threshold Switching Memristors: Toward Neuromorphic Thermosensation.

Neuromorphic nanoelectronic devices that can emulate the temperature-sensitive dynamics of biological neurons are of great interest for bioinspired robotics and advanced applications such as in silico neuroscience. In this work, we demonstrate the biomimetic thermosensitive properties of two-terminal V3O5 memristive devices and showcase their similarity to the firing characteristics of thermosensitive biological neurons. The temperature-dependent electrical characteristics of V3O5-based memristors are used to understand the spiking response of a simple relaxation oscillator. The temperature-dependent dynamics of these oscillators are then compared with those of biological neurons through numerical simulations of a conductance-based neuron model, the Morris-Lecar neuron model. Finally, we demonstrate a robust neuromorphic thermosensation system inspired by biological thermoreceptors for bioinspired thermal perception and representation. These results not only demonstrate the biorealistic emulative potential of threshold-switching memristors but also establish V3O5 as a functional material for realizing solid-state neurons for neuromorphic computing and sensing applications.

Physical Origin of Negative Differential Resistance in V3 O5 and Its Application as a Solid-State Oscillator.

Oxides that exhibit an insulator-metal transition can be used to fabricate energy-efficient relaxation oscillators for use in hardware-based neural networks but there are very few oxides with transition temperatures above room temperature. Here the structural, electrical, and thermal properties of V3 O5 thin films and their application as the functional oxide in metal/oxide/metal relaxation oscillators are reported. The V3 O5 devices show electroforming-free volatile threshold switching and negative differential resistance (NDR) with stable (<3% variation) cycle-to-cycle operation. The physical mechanisms underpinning these characteristics are investigated using a combination of electrical measurements, in situ thermal imaging, and device modeling. This shows that conduction is confined to a narrow filamentary path due to self-confinement of the current distribution and that the NDR response is initiated at temperatures well below the insulator-metal transition temperature where it is dominated by the temperature-dependent conductivity of the insulating phase. Finally, the dynamics of individual and coupled V3 O5 -based relaxation oscillators is reported, showing that capacitively coupled devices exhibit rich non-linear dynamics, including frequency and phase synchronization. These results establish V3 O5 as a new functional material for volatile threshold switching and advance the development of robust solid-state neurons for neuromorphic computing.

High Spatial Resolution Thermal Mapping of Volatile Switching in NbOx-Based Memristor Using In Situ Scanning Thermal Microscopy.

Temperature mapping by in situ thermoreflectance thermal imaging (TRTI) or midwave infrared spectroscopy has played an important role in understanding the origins of threshold switching and the effect of insulator-metal transitions in oxide-based memrsitive devices. In this study, we use scanning thermal microscopy (SThM) as an alternative thermal mapping technique that offers high spatial resolution imaging (∼100 nm) and is independent of material. Specifically, SThM is used to map the temperature distribution in NbOx-based cross-bar and nanovia devices with Pt top electrodes. The measurements on cross-bar devices reproduce the current redistribution and confinement processes previously observed by TRTI but without the need to coat the electrodes with a material of high thermo-reflectance coefficient (e.g., Au), while those on the nanovia devices highlight the spatial resolution of the technique. The measured temperature distributions are compared with those obtained from physics-based finite-element simulations and suggest that thermal boundary resistance plays an important role in heat transfer between the active device volume and the top electrode.

A new technique based on current measurement for nanoscale ferroelectricity assessment: Nano-positive up negative down.

In this paper, we propose a new procedure which aims at measuring the polarisation switching current at the nanoscale on ferroelectric thin films with the atomic force microscope tip used as a top electrode. Our technique is an adaptation of the so-called positive up negative down method commonly operated on large electrodes. The main obstacle that must be overcome to implement such measurement is the enhancement of the signal to noise ratio, in a context where the stray capacitance of the sample/tip/lever/lever holder system generates a dielectric displacement current several orders of magnitude higher than the current to be measured. This problem is solved by the subtraction of the displacement current through a reference capacitance. For the first time, we show an example of nanoscale positive up negative down measurement of the polarisation charge on a PbZrTiO3 thin film and compare the measured value with paraelectric samples. From the comparison with macroscopic measurement, we deduce the effective area of contact between the tip and the sample.

Interpretation of multiscale characterization techniques to assess ferroelectricity: The case of GaFeO3.

In this paper, we propose a thorough experimental procedure to assess the ferroelectricity of thin films, and apply this procedure to Pulsed Laser Deposition grown GaFeO3 thin films at the macroscale by means of Polarisation-Voltage hysteresis and at the nanoscale by Piezoresponse Force Microscopy. GaFeO3 is a serious candidate for the multiferroicity at room temperature, being ferrimagnetic and possibly ferroelectric. However, the non-ambiguous measurement of ferroelectric polarisation of such thin films remains a challenge. We show that although doped to decrease the leakage currents, the samples remain too leaky to allow any detection of a polarisation current, whereas Piezoresponse Force Microscopy images are indeed obtained in certain conditions. Nevertheless, the images obtained from scanning probe methods must be questioned in that context. This is why we propose to obtain PFM images at much higher frequencies to discriminate between artefactual images and true ferroelectric behaviour. The application of the method combined with the comparison with results obtained on a PbZrTiO3 sample allow to rule out the ferroelectricity of our GaFeO3 samples. Beyond the problem of GaFeO3, our objective is to propose a method which enables to assess objectively the ferroelectricity of any leaky film.