Determination of new multiple deferred state sampling plan with economic perspective under Weibull distribution.

This study focuses on designing a new multiple deferred state sampling plan to ensure products' mean lifetime that complies with Weibull distribution. The parameters that characterize the proposed plan are determined by considering two specified points on the operating characteristic curve. Practical applications of the proposed plan for assuring mean lifetimes of electrical appliances as well as Lithium-ion batteries are explained by using real-time data and simulated data respectively. Sensitivity analysis on testing time of the life test is done and theoretical average sample number is compared with the same obtained by simulation. By comparing the proposed plan with other existing sampling plans based on discriminating power, the number of units required for lot sentencing, it is observed that the new multiple deferred state sampling plan provides quality assurance for the products with low inspection costs compared to the other existing sampling plans. Besides, this study investigates the economic design of a new multiple deferred state sampling plan and compares the total cost needed in the proposed plan with the same required for some other existing sampling plans.

A new system of skip-lot sampling plans including resampling.

Skip-lot sampling plans have been widely used in industries to reduce the inspection efforts when products have good quality records. These schemes are known as economically advantageous and useful to minimize the cost of the inspection of the final lots. A new system of skip-lot sampling plan called SkSP-R is proposed in this paper. The performance measures for the proposed SkSP-R plan are derived using the Markov chain formulation. The proposed plan is found to be more efficient than the single sampling plan and the SkSP-2 plan.