RESUMO
A spatially varying transverse magnetic filter field (TMF) is present in an E [Formula: see text] B plasma-based negative ion source to improve negative ion yield. The TMF strength ranges from 1 to 10 mT, causing the plasma electrons to become magnetized while leaving the ions either unmagnetized or partially magnetized. As a consequence, plasma drift, particle trapping, double layer (DL), and instabilities are observed in a negative ion source. The transport of plasma through the TMF is influenced by these phenomena, subsequently affecting the energy distribution functions (EDFs) of both electrons and ions in the plasma. Measurement of EDFs in such systems is a challenging task due to the presence of a strong magnetic field. To address this, a 2D-3V Particle-in-Cell Monte Carlo Collision (PIC MCC) model is employed to study the spatio-temporal evolution of the EDFs separately for electrons and ions. The electron EDF (EEDF) remains Maxwellian, while ion EDF (IEDF) gradually transitions to non-Maxwellian as measurements are taken closer to the TMF region. The present study reveals that the IEDF is more sensitive to the operational conditions compared to the EEDF, as evidenced by the changes observed in both EDFs under different plasma operational conditions.
RESUMO
The present work is to develop an infra-red (IR) camera based in situ diagnostic tool for the determination of cesium (Cs) coverage suitable for ion source applications. Cs seeding is done to reduce the surface work function that enhances the surface assisted negative hydrogen ion production. The temporal Cs deposition on a metal surface (for, e.g., tungsten or molybdenum) follows Langmuir adsorption isotherm (LAI) kind of behavior. The surface temperature varies while the Cs deposition is reflected in the IR camera temperature measurements for a constant surface emissivity value. In this paper, a model on the relationship between Cs coverage in correlation with surface emissivity and temperature variation based on the theory of LAI is presented. A surface ionization probe (SIP) in the form of a cathode-anode assembly together with an IR camera viewing arrangement is designed to measure the Cs flux and the surface temperature simultaneously to test our model. In the present experiment, the Cs flux measurement using SIP is validated with a standard quartz crystal microbalance (QCM). The proposed model would be useful to correlate Cs coverage on plasma grid-like surface conditions under negative ion source relevant vacuum conditions.
