RESUMO
A convenient method is described for optical characterization of thin films during growth. The method has been demonstrated on lead zirconate titanate (PZT) films deposited by pulsed laser ablation for various temperatures. The optical constants of the PZT films as well as the film growth rate were determined in situ by fitting (with three free parameters) the calculated reflectance as a function of film thickness to the experimental reflectance curve as a function of deposition time, as obtained by unpolarized laser reflectometry. The fitted parameters are the uniform complex PZT refractive index and the layer thickness (assumed proportional to time), with the complex refractive index of the platinum substrate being measured previously. These results compare well with the subsequent ellipsometric measurements made to assess the precision of the reflectometry technique.
RESUMO
We describe a technique for spectrally and temporally resolving the kilo-electron-volt emission fromultrashort plasmas produced from solid targets with a tabletop terawatt 400-fs laser. The firsttime-resolved Al spectra (near 8 Å) obtained with a 2-ps time resolution are presented. The results clearly demonstrate that the resonance emission width decreases as the plasma density increases. The ultrafast K(α) emission component is also measured in our experimental conditions.
RESUMO
We communicate results of the stable operation of a TEA CO(2) oscillator-amplifiers system, producing pulses of 10(14) W/cm(2) at best focus, furnished with a simple provision for retropulse isolation.
RESUMO
The nonlinear refractive index n(2) of CS(2) at 10.6 microm, the value of which is a subject of a recent controversy, is measured by an external self-focusing method. We found that n(2) = (2.1 +/- 0.7) x 10(-11) esu, similar to the accepted value of n(2) in the visible. Self-bending of spatially asymmetric CO(2) laser beam in CS(2) due to an ultrafast Kerr effect is observed, and the deduced value of n(2) is in agreement with our results.
