Automated disassembly of e-waste-requirements on modeling of processes and product states.

Automated disassembly is increasingly in focus for Recycling, Re-use, and Remanufacturing (Re-X) activities. Trends in digitalization, in particular digital twin (DT) technologies and the digital product passport, as well as recently proposed European legislation such as the Net Zero and the Critical materials Acts will accelerate digitalization of product documentation and factory processes. In this contribution we look beyond these activities by discussing digital information for stakeholders at the Re-X segment of the value-chain. Furthermore, we present an approach to automated product disassembly based on different levels of available product information. The challenges for automated disassembly and the subsequent requirements on modeling of disassembly processes and product states for electronic waste are examined. The authors use a top-down (e.g., review of existing standards and process definitions) methodology to define an initial data model for disassembly processes. An additional bottom-up approach, whereby 5 exemplary electronics products were manually disassembled, was employed to analyze the efficacy of the initial data model and to offer improvements. This paper reports on our suggested informal data models for automatic electronics disassembly and the associated robotic skills.

Spatially resolved scatter measurement of diffractive micromirror arrays.

Spatial light modulators (SLMs) support flexible system concepts in modern optics and especially phase-only SLMs such as micromirror arrays (MMAs) appear attractive for many applications. In order to achieve a precise phase modulation, which is crucial for optical performance, careful characterization and calibration of SLM devices is required. We examine an intensity-based measurement concept, which promises distinct advantages by means of a spatially resolved scatter measurement that is combined with the MMA's diffractive principle. Measurements yield quantitative results, which are consistent with measurements of micromirror roughness components, by white-light interferometry. They reveal relative scatter as low as 10-4, which corresponds to contrast ratios up to 10,000. The potential of the technique to resolve phase changes in the subnanometer range is experimentally demonstrated.