1.
Ultramicroscopy
; 111(9-10): 1483-7, 2011.
Artigo
em Inglês
| MEDLINE
| ID: mdl-21930020
RESUMO
The application of scanning transmission electron microscopy (STEM) to crystalline defect analysis has been extended to dislocations. The present contribution highlights the use of STEM on two oppositely signed sets of near-screw dislocations in hcp α-Ti with 6wt% Al in solid solution. In addition to common systematic row diffraction conditions, other configurations such as zone axis and 3g imaging are explored, and appear to be very useful not only for defect analysis, but for general defect observation. It is demonstrated that conventional TEM rules for diffraction contrast such as g·b and g·R are applicable in STEM. Experimental and computational micrographs of dislocations imaged in the aforementioned modes are presented.
Assuntos
Processamento de Imagem Assistida por Computador/métodos , Microscopia Eletrônica de Transmissão e Varredura/métodos , Simulação por Computador , Microscopia Eletrônica de Transmissão e Varredura/instrumentação
2.
Am J Obstet Gynecol
; 155(3): 655-7, 1986 Sep.
Artigo
em Inglês
| MEDLINE
| ID: mdl-3019142